Analysis of interface magnetic structures in magnetic thin films using resonant X-ray scattering techniques
Grant-in-Aid for Scientific Research (A)
Nara Institute of Science and Technology;Tokyo Institute of Technology
Hiroo HASHIZUME
From 01 Apr. 1997, To 31 Mar. 2000, Project Closed
共鳴X線磁気散乱;シンクロトロン放射;磁気多層膜;磁気構造相転移;円偏光X線;界面磁気ラフネス;磁性多層膜;薄膜不均一磁化;薄膜磁性;共鳴X線散乱;X線磁気散乱;磁気構造転移;磁気界面;界面ラフネス;ヘリシティ切換え;Fe;Gd多層膜;捩れ磁気構造, Resonant X-ray magnetic scattering;Synchrotron radiation;Magnetic multilayer;Magnetic structure transition;Circular polarized X-rays;Magnetic interface roughness