Basic Information

Email Address

• Email Address

  liu.kunyang.6kkyoto-u.ac.jp

Professional Memberships

• From Apr. 2024, To Present

  Information Processing Society of Japan (IPSJ)
• From Feb. 2023, To Present

  電子情報通信学会
• From Jan. 2017, To Present

  Institute of Electrical and Electronics Engineers (IEEE)

Academic Degree

• 15 Sep. 2017

  早稲田大学修士（工学）
• 19 Apr. 2021

  早稲田大学博士（工学）

Academic Resume (Graduate Schools)

• 早稲田大学, 大学院情報生産システム研究科博士後期課程情報生産システム工学専攻, 修了
• 早稲田大学, 大学院情報生産システム研究科博士前期課程情報生産システム工学専攻, 修了

Academic Resume (Undergraduate School/Majors)

• 華南理工大学, 電子情報学部電子情報工学専攻, 卒業

Research History

• From Feb. 2024, To Present

  Kyoto University, Graduate School of Informatics, Assistant Professor
• From Sep. 2021, To Jan. 2024

  Waseda University, Information Production and Systems Research Center, Assistant Professor
• From Apr. 2021, To Sep. 2021

  Waseda University, Information Production and Systems Research Center, Research Associate

ID,URL

• ORCID ID

  0000-0002-9328-7076

• J-Global ID

  202101003341081893

researchmap URL

• https://researchmap.jp/kylau

Research

Research Areas

• Informatics, Computer systems, Integrated circuit design
• Manufacturing technology (mechanical, electrical/electronic, chemical engineering), Electronic devices and equipment
• Informatics, Information security, Hardware security, IC for security

Papers

• Design and Experimental Verification of 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording

  Hiroaki Kitaike; Hironori Tagawa; Shufan Xu; Ruilin Zhang; Kunyang Liu; Kiichi Niitsu

  IEEE Transactions on Circuits and Systems II: Express Briefs, 2025

  
• Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function

  Shufan Xu; Kunyang Liu; Kiichi Niitsu; Hirofumi Shinohara

  IEEE Transactions on Device and Materials Reliability, 2025

  Access this paper :

  
• De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator

  Ruilin Zhang; Haochen Zhang; Xingyu Wang; Ye Ziyang; Kunyang Liu; Shinichi Nishizawa; Kiichi Niitsu; Hirofumi Shinohara

  IEEE Transactions on Circuits and Systems I: Regular Papers, 2024

  
• A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response

  Kunyang Liu; Yichen Tang; Shufan Xu; Ruilin Zhang; Hirofumi Shinohara

  2023 IEEE Custom Integrated Circuits Conference (CICC), Apr. 2023, Peer-reviewed, Lead author

  
• V_SS-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-in

  Kunyang Liu; Yichen Tang; Shufan Xu; Hirofumi Shinohara

  2023 35th International Conference on Microelectronic Test Structure (ICMTS), 27 Mar. 2023, Peer-reviewed, Lead author

  
• Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection

  Shufan Xu; Kunyang Liu; Yichen Tang; Ruilin Zhang; Hirofumi Shinohara

  2023 35th International Conference on Microelectronic Test Structure (ICMTS), 27 Mar. 2023, Peer-reviewed

  
• A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement

  Xingyu Wang; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara

  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023, Peer-reviewed

  
• A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance

  Kunyang Liu; Gen Li; Zihan Fu; Xuanzhen Wang; Hirofumi Shinohara

  ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC), 19 Sep. 2022, Peer-reviewed, Lead author

  
• Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In

  Kunyang Liu; Kiyoshi Takeuchi; Hirofumi Shinohara

  2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), 21 Mar. 2022, Peer-reviewed, Lead author

  
• A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement

  Ruilin Zhang; Xingyu Wang; Kunyang Liu; Hirofumi Shinohara

  IEEE JOURNAL OF SOLID-STATE CIRCUITS, Mar. 2022, Peer-reviewed

  
• A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement

  Xingyu Wang; Ruilin Zhang; Yuxin Wang; Kunyang Liu; Xuanzhen Wang; Hirofumi Shinohara

  2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings, 2022, Peer-reviewed

  
• A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement

  Ruilin Zhang; Xingyu Wang; Luying Wang; Xinpeng Chen; Fan Yang; Kunyang Liu; Hirofumi Shinohara

  2021 Symposium on VLSI Circuits, 13 Jun. 2021, Peer-reviewed

  
• 36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate through In-Cell Hot-Carrier Injection Burn-In

  Kunyang Liu; Zihan Fu; Gen Li; Hongliang Pu; Zhibo Guan; Xingyu Wang; Xinpeng Chen; Hirofumi Shinohara

  Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 13 Feb. 2021, Peer-reviewed, Lead author

  
• An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit

  Xingyu Wang; Hongjie Liu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara

  Midwest Symposium on Circuits and Systems, Aug. 2020, Peer-reviewed

  
• A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS } } Bias-Based Dark-Bit Detection

  Kunyang Liu; Yue Min; Xuan Yang; Hanfeng Sun; Hirofumi Shinohara

  IEEE Journal of Solid-State Circuits, Jun. 2020, Peer-reviewed, Lead author

  
• A 0.5-V 2.07-fJ/b 497-F² EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in

  Kunyang Liu; Hongliang Pu; Hirofumi Shinohara

  Proceedings of the Custom Integrated Circuits Conference, Mar. 2020, Peer-reviewed, Lead author

  
• A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement

  Kunyang Liu; Xinpeng Chen; Hongliang Pu; Hirofumi Shinohara

  IEEE Journal of Solid-State Circuits, 2020, Peer-reviewed, Lead author

  
• A 373 F ² 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique

  Kunyang Liu; Yue Min; Xuan Yang; Hanfeng Sun; Hirofumi Shinohara

  2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings, 14 Dec. 2018, Peer-reviewed, Lead author

  

Presentations

• SRAMエントロピー源とSPN構造により100ビット出力空間とモデリング攻撃耐性を両立したストロングPUF

  劉 昆洋; 唐 芸琛; 徐 舒帆; 新津 葵一; 篠原 尋史

  電子情報通信学会集積回路研究会（ICD）、メモリ技術と集積回路技術一般, 11 Apr. 2024, Invited

  
• SRAMウィークPUFに基づいた秘密置換を利用したエッジデバイスセキュリティ向けストロングPUF

  劉 昆洋; 篠原 尋史

  電子情報通信学会集積回路研究会（ICD）、メモリ技術と集積回路技術一般, 10 Apr. 2023, Invited

  
• 情報セキュリティのためのラッチ形静的および動的乱数発生回路

  篠原 尋史; 劉 昆洋; 張 瑞琳; 王 興宇

  電子情報通信学会集積回路研究会（ICD）、アナログ、アナデジ混載、RF及びセンサインタフェース回路、低電圧・低消費電力技術、新デバイス・回路とその応用, 18 Aug. 2021, Invited

  
• A 373F2 2D-Power-Gated EE SRAM Physically Unclonable Function with Dark‐Bit Detection Technique

  Kunyang Liu; Hirofumi Shinohara

  電子情報通信学会集積回路研究会（ICD）、メモリ技術と集積回路技術一般, 22 Apr. 2019, Invited

  

Awards

• 20 Jan. 2025

  Best Design Award at ACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) 2025
• 18 Apr. 2023

  2022 VLSI-DAT Best Paper Award（ITRI＆IEEE）
• 22 Nov. 2019

  ISIPS2019 Presentation Award Selected by IPS Students（早稲田大学）
• 15 Nov. 2017

  ISIPS2017 Best Paper Award（早稲田大学大学院情報生産システム研究科）
• 01 Feb. 2021

  2020 Excellent Student Award of The IEEE Fukuoka Section（IEEE Fukuoka Section）
• 13 Nov. 2020

  ISIPS2020 Session Best Presentation Award（早稲田大学）
• 05 Nov. 2018

  2018 IEEE SSCS A-SSCC Student Travel Grant Award（IEEE SSCS）

External funds: Kakenhi

• Research on Low-Power High-Stability IoT Security Circuits Achieved Through Semiconductor Aging Technique

  Grant-in-Aid for Early-Career Scientists

  Basic Section 60040:Computer system-related

  Kyoto University

  劉 昆洋

  From 01 Apr. 2025, To 31 Mar. 2028, Granted

  PUF;TRNG;ハードウェアセキュリティ;エージング;半導体集積回路

  https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-25K21173/

Education

Teaching subject(s)

• From 01 Apr. 2025, To 31 Mar. 2026

  Practice of Electrical and Electronic Engineering

  6201, Spring, Faculty of Engineering, 2
• From 01 Apr. 2024, To 31 Mar. 2025

  Practice of Electrical and Electronic Engineering

  6201, Spring, Faculty of Engineering, 2

Academic, Social Contribution

Academic Contribution

• 集積回路研究専門委員会専門委員

  Planning, management, etc.

  電子情報通信学会, From 01 Jun. 2024, To Present

  
• Journal of Information Processing編集委員会委員

  Planning, management, etc., Supervision (editorial)

  情報処理学会, From 01 Jun. 2024, To 31 May 2026

  
• システムとLSIの設計技術研究運営委員会運営委員

  Planning, management, etc.

  情報処理学会, From 01 Apr. 2024, To 31 Mar. 2026

  
• IEEE Transactions on Circuits and Systems I: Regular Papers

  Peer review

  
• IEEE JOURNAL OF SOLID-STATE CIRCUITS

  Peer review

  
• IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS

  Peer review

  
• IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

  Peer review