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Liu, Kunyang

Graduate School of Informatics, Department of Informatics Assistant Professor

Liu, Kunyang
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    Last Updated :2026/09/04

    Basic Information

    Email Address

    • Email Address

      liu.kunyang.6kkyoto-u.ac.jp

    Professional Memberships

    • From Apr. 2024, To Present
      Information Processing Society of Japan (IPSJ)
    • From Feb. 2023, To Present
      The Institute of Electronics, Information and Communication Engineers (IEICE)
    • From Jan. 2017, To Present
      Institute of Electrical and Electronics Engineers (IEEE)

    Academic Degree

    • 15 Sep. 2017
      早稲田大学修士(工学)
    • 19 Apr. 2021
      早稲田大学博士(工学)

    Academic Resume (Graduate Schools)

    • 早稲田大学, 大学院情報生産システム研究科博士後期課程情報生産システム工学専攻, 修了
    • 早稲田大学, 大学院情報生産システム研究科博士前期課程情報生産システム工学専攻, 修了

    Academic Resume (Undergraduate School/Majors)

    • 華南理工大学, 電子情報学部電子情報工学専攻, 卒業

    Research History

    • From Feb. 2024, To Present
      Kyoto University, Graduate School of Informatics, Assistant Professor
    • From Sep. 2021, To Jan. 2024
      Waseda University, Information Production and Systems Research Center, Assistant Professor
    • From Apr. 2021, To Sep. 2021
      Waseda University, Information Production and Systems Research Center, Research Associate

    ID,URL

    researchmap URL

    list
      Last Updated :2026/09/04

      Research

      Research Areas

      • Informatics, Computer systems, Integrated circuit design
      • Manufacturing technology (mechanical, electrical/electronic, chemical engineering), Electronic devices and equipment
      • Informatics, Information security, Hardware security, IC for security

      Papers

      • A 3.22-pJ/bit, 3.5-MF2 Modeling-Attack-Resilient Lightweight Strong PUF Based on Add-Rotate-XOR
        Zhenzhe Chen; Kunyang Liu; Weirong Dong; Takashi Sato
        IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2026, Peer-reviewed
      • A 236-nW LFSR-Based Asymmetric Clonable PUF Group With Peer-to-Peer Response Equivalence
        Zhenzhe Chen; Weirong Dong; Kunyang Liu; Quan Cheng; Hirofumi Shinohara; Takashi Sato
        IEEE Transactions on Circuits and Systems I: Regular Papers, 2026, Peer-reviewed
      • An 83-F2 2T PUF Featuring Isolated Hot-Carrier Injection and Lightweight Majority-Voting-Based Strong PUF Mode
        Zhenzhe Chen; Kunyang Liu; Weirong Dong; Quan Cheng; Jiamin Li; Longyang Lin; Takashi Sato
        2026 IEEE Custom Integrated Circuits Conference (CICC), Apr. 2026, Peer-reviewed
      • A Sub-Threshold All-NMOS Reconfigurable PUF with Secure Configuration Selection for Stable 6b/Cell
        Shufan Xu; Kunyang Liu; Lando Chan; Hironori Tagawa; Hirofumi Shinohara; Kiichi Niitsu
        2026 IEEE International Solid-State Circuits Conference (ISSCC), 15 Feb. 2026, Peer-reviewed, Corresponding author
      • ARXPUF: A Modeling Attack Resilient Lightweight Strong PUF based on Add-Rotate-Xor
        Zhenzhe Chen; Weirong Dong; Kunyang Liu; Takashi Sato
        2025 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 19 Dec. 2025, Peer-reviewed
      • A 22nm CMOS 0.017mm 2 0.9V 0.26nW-Standby-Power 2.7mW-Peak-Power 37GHz Biocompatibly-Covered Ingestible OOK Transmitter Enabling 1cm Communication Via Simulated Large Intestine Model for Digital Pills
        Kento Okamura; Takeshi Fujiyabu; Hisataka Maruyama; Kei Awano; You Wu; Hiroaki Kitaike; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara; Daisuke Anzai; Natsuko Inagaki; Taichi Ito; Kiichi Niitsu
        2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), 17 Nov. 2025, Peer-reviewed
      • A Less than 6.5E-8 BER 36-Way Reconfigurable PUF with 4-bit Stable Responses per Cell Featuring Machine Learning-Based Best-Configuration Selection
        Shufan Xu; Kunyang Liu; Nan Wang; Hirofumi Shinohara; Kiichi Niitsu
        2025 IEEE Asian Solid-State Circuits Conference (A-SSCC), 02 Nov. 2025, Peer-reviewed, Corresponding author
      • Design and Experimental Verification of A 0.14-0.55V 1.9-24.2pW 22nm 3-bit Binary Search Supply-to-Digital Converter Using One-Hot Hard-Wired Topology and Supply-Dependent-Activation Buffers for Supply Sensing IoT Systems
        Hiroaki Kitaike; Hironori Tagawa; Kento Okamura; Wu You; Kei Awano; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Kunyang Liu; Hirofumi Shinohara; Kiichi Niitsu
        2025 IEEE Nordic Circuits and Systems Conference (NorCAS), 28 Oct. 2025, Peer-reviewed
      • A 65nm 0.0736mm 2 /Pixel Simultaneous Energy-Harvesting-and-Sensing 2-by-2 Self-Powered CMOS Image Sensor Pixel Array Using Self-Oscillating Voltage Doubler for Thermal-Aware Zero-Stand-by-Power Imaging
        Kei Awano; Yoshitsune Sugimura; Yuma Ota; You Wu; Keishi Ogura; Hiroaki Kitaike; Kento Okamura; Shufan Xu; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Ruilin Zhang; Hirofumi Shinohara; Kunyang Liu; Kiichi Niitsu
        2025 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 12 Oct. 2025, Peer-reviewed
      • A 65-nm CMOS Downconverter-Less Clock Generator Architecture Using Voltage Stacking of Oscillator and Frequency Dividers for Scaling-Friendly IoTs
        You Wu; Kei Awano; Kento Okamura; Teruaki Ono; Kohei Sakamoto; Hiroaki Kitaike; Hironori Tagawa; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara; Kiichi Niitsu
        IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Oct. 2025, Peer-reviewed
      • A 110-mV 12-pW 0.00006-mm2 7-nm FinFET Self-Oscillating Voltage Doubler Using Vertically Implemented Back-End Metal-Oxide-Metal Capacitors for Small-Formfactor Up-Conversion
        Kei Awano; You Wu; Hiroaki Kitaike; Kento Okamura; Teruaki Ono; Kohei Sakamoto; Hironori Tagawa; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Ruilin Zhang; Hirofumi Shinohara; Kunyang Liu; Kiichi Niitsu
        2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS), 10 Aug. 2025, Peer-reviewed
      • A 22 nm CMOS .000005 mm2 0.25 V 2.3pW ISFET Front-End Using Low-Gate-Leakage Thick-Gate-Oxide Transistors for Energy-Efficient Small-Formfactor pH Monitoring
        Hiroaki Kitaike; Ruilin Zhang; Hironori Tagawa; Kento Okamura; Kei Awano; You Wu; Teruaki Ono; Kohei Sakamoto; Jin Nakamura; Masaya Kaneko; Kunyang Liu; Shufan Xu; Hirofumi Shinohara; Kiichi Niitsu
        2025 23rd IEEE Interregional NEWCAS Conference (NEWCAS), 22 Jun. 2025, Peer-reviewed
      • A 22 nm CMOS 0.034 mm2 0.4 V 1.3 nW Frequency-Recording IC with 400-Bit Data-Storing Shift Registers Using Burst-Pulse Counting and Reference Pulse Generation for Stand-Alone Continuous Glucose Monitoring Contact Lenses
        Kei Awano; You Wu; Kento Okamura; Teruaki Ono; Kohei Sakamoto; Hiroaki Kitaike; Hironori Tagawa; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara; Kiichi Niitsu
        2025 IEEE 16th Latin America Symposium on Circuits and Systems (LASCAS), 25 Feb. 2025, Peer-reviewed
      • A 115mV 300fW 0.24Hz 0.00012 $\text{mm}^{2}$ Schmitt-Trigger Ring Oscillator Using Dynamic Leakage Suppression with Cold Start Capability in 22nm CMOS
        Yoshiki Kiyobayashi; Hiroaki Kitaike; Jin Nakamura; Masaya Kaneko; Hironori Tagawa; Kento Okamura; Kei Awano; You Wu; Teruaki Ono; Kohei Sakamoto; Shufan Xu; Hiroaki Nakamura; Yuta Kimura; Kunyang Liu; Ruilin Zhang; Hirofumi Shinohara; Kiichi Niitsu
        2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS), 18 Nov. 2024, Peer-reviewed
      • A 0.00027 mm2 1.2V 0.089pJ/bit 10Gbps 41.6 GHz Standard-Cell-Based Passive-Less Wireless OOK Transmitter with On-Chip Antenna in 12nm FinFET
        Hiroaki Kitaike; Hironori Tagawa; Masaya Kaneko; Jin Nakamura; Shufan Xu; Ruilin Zhang; Kunyang Liu; Hiroki Wakatsuchi; Kyoya Takano; Hirofumi Shinohara; Kiichi Niitsu
        2024 IEEE Nordic Circuits and Systems Conference (NorCAS), 29 Oct. 2024, Peer-reviewed
      • A 2 Hz, 1.2-2 V, 0.22-9 nW, 0.007 mm2 65 nm CMOS Multiple- Output Down-Converter-Less Clock Generator Using Stacked an Oscillator and Frequency Dividers for Scaling-Friendly IoTs
        You Wu; Kei Awano; Kento Okamura; Teruaki Ono; Kohei Sakamoto; Hiroaki Kitaike; Hironori Tagawa; Jin Nakamura; Masaya Kaneko; Yuta Kimura; Hiroaki Nakamura; Shufan Xu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara; Kiichi Niitsu
        2024 IEEE Nordic Circuits and Systems Conference (NorCAS), 29 Oct. 2024, Peer-reviewed
      • CLAPPER: Clonable LFSR-based Asymmetric PUF-group with Peer-to-peer Equivalent Response
        Zhenzhe Chen; Kunyang Liu; Hirofumi Shinohara; Takashi Sato
        2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS), 11 Aug. 2024, Peer-reviewed
      • A 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording
        Hiroaki Kitaike; Masaharu Inada; Mitsuru Terauchi; Hironori Tagawa; Ryosuke Nagai; Shufan Xu; Ruilin Zhang; Kunyang Liu; Kiichi Niitsu
        2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 16 Jun. 2024, Peer-reviewed
      • A Latch-Based Stochastic Number Generator for Stochastic Computing of Extended Naïve Bayesian Network
        Ruilin Zhang; Yangjun Xiao; Jiawei Liu; Xingyu Wang; Shufan Xu; Kunyang Liu; Shinichi Nishizawa; Kiichi Niitsu; Hirofumi Shinohara
        2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA), 22 Apr. 2024, Peer-reviewed
      • Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators
        Ruilin Zhang; Haochen Zhang; Xingyu Wang; Ye Ziyang; Kunyang Liu; Hirofumi Shinohara
        2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), 06 Aug. 2023, Peer-reviewed
      • A Physically Unclonable Function With Less Than 4.16E--7 BER Featuring Secure In-Cell HCI Burn-In and nMOS-Dominant PUF Data Generation
        Kunyang Liu; Zihan Fu; Gen Li; Hongliang Pu; Zhibo Guan; Xingyu Wang; Shufan Xu; Kiichi Niitsu; Hirofumi Shinohara
        IEEE Journal of Solid-State Circuits, Aug. 2026, Peer-reviewed, Lead author, Corresponding author
      • Design and Experimental Verification of 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording
        Hiroaki Kitaike; Hironori Tagawa; Shufan Xu; Ruilin Zhang; Kunyang Liu; Kiichi Niitsu
        IEEE Transactions on Circuits and Systems II: Express Briefs, Nov. 2025, Peer-reviewed
      • Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function
        Shufan Xu; Kunyang Liu; Kiichi Niitsu; Hirofumi Shinohara
        IEEE Transactions on Device and Materials Reliability, Sep. 2025, Peer-reviewed
      • De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator
        Ruilin Zhang; Haochen Zhang; Xingyu Wang; Ye Ziyang; Kunyang Liu; Shinichi Nishizawa; Kiichi Niitsu; Hirofumi Shinohara
        IEEE Transactions on Circuits and Systems I: Regular Papers, Nov. 2024, Peer-reviewed
      • A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response
        Kunyang Liu; Yichen Tang; Shufan Xu; Ruilin Zhang; Hirofumi Shinohara
        2023 IEEE Custom Integrated Circuits Conference (CICC), Apr. 2023, Peer-reviewed, Lead author
      • VSS-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-in
        Kunyang Liu; Yichen Tang; Shufan Xu; Hirofumi Shinohara
        2023 35th International Conference on Microelectronic Test Structure (ICMTS), 27 Mar. 2023, Peer-reviewed, Lead author
      • Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection
        Shufan Xu; Kunyang Liu; Yichen Tang; Ruilin Zhang; Hirofumi Shinohara
        2023 35th International Conference on Microelectronic Test Structure (ICMTS), 27 Mar. 2023, Peer-reviewed
      • A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement
        Xingyu Wang; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara
        IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023, Peer-reviewed
      • A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance
        Kunyang Liu; Gen Li; Zihan Fu; Xuanzhen Wang; Hirofumi Shinohara
        2022 IEEE 48th European Solid State Circuits Conference (ESSCIRC), 19 Sep. 2022, Peer-reviewed, Lead author
      • Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In
        Kunyang Liu; Kiyoshi Takeuchi; Hirofumi Shinohara
        2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), 21 Mar. 2022, Peer-reviewed, Lead author
      • A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement
        Ruilin Zhang; Xingyu Wang; Kunyang Liu; Hirofumi Shinohara
        IEEE Journal of Solid-State Circuits, Aug. 2022, Peer-reviewed
      • A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement
        Xingyu Wang; Ruilin Zhang; Yuxin Wang; Kunyang Liu; Xuanzhen Wang; Hirofumi Shinohara
        2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings, 2022, Peer-reviewed
      • A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement
        Ruilin Zhang; Xingyu Wang; Luying Wang; Xinpeng Chen; Fan Yang; Kunyang Liu; Hirofumi Shinohara
        2021 Symposium on VLSI Circuits, 13 Jun. 2021, Peer-reviewed
      • A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In
        Kunyang Liu; Zihan Fu; Gen Li; Hongliang Pu; Zhibo Guan; Xingyu Wang; Xinpeng Chen; Hirofumi Shinohara
        2021 IEEE International Solid- State Circuits Conference (ISSCC), 13 Feb. 2021, Peer-reviewed, Lead author
      • An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit
        Xingyu Wang; Hongjie Liu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara
        Midwest Symposium on Circuits and Systems, Aug. 2020, Peer-reviewed
      • A 373-F2 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection
        Kunyang Liu; Yue Min; Xuan Yang; Hanfeng Sun; Hirofumi Shinohara
        IEEE Journal of Solid-State Circuits, Jun. 2020, Peer-reviewed, Lead author
      • A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with <1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in
        Kunyang Liu; Hongliang Pu; Hirofumi Shinohara
        2020 IEEE Custom Integrated Circuits Conference (CICC), Mar. 2020, Peer-reviewed, Lead author
      • A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement
        Kunyang Liu; Xinpeng Chen; Hongliang Pu; Hirofumi Shinohara
        IEEE Journal of Solid-State Circuits, Jul. 2021, Peer-reviewed, Lead author
      • A 373 F 2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique
        Kunyang Liu; Yue Min; Xuan Yang; Hanfeng Sun; Hirofumi Shinohara
        2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings, 14 Dec. 2018, Peer-reviewed, Lead author

      Presentations

      • 物理複製不可能関数(PUF)集積回路におけるビットエラー低減技術
        劉 昆洋
        電子情報通信学会 ソサイエティ大会, 25 Sep. 2026, Invited
      • 均一かつ高ランダム性のレスポンスを持つ、100ビット出力のモデリング攻撃耐性型SPN方式ストロングPUF回路
        劉 昆洋
        第24回情報科学技術フォーラム(FIT2025), 03 Sep. 2025, Invited
      • SRAMエントロピー源とSPN構造により100ビット出力空間とモデリング攻撃耐性を両立したストロングPUF
        劉 昆洋; 唐 芸琛; 徐 舒帆; 新津 葵一; 篠原 尋史
        電子情報通信学会集積回路研究会(ICD)、メモリ技術と集積回路技術一般, 11 Apr. 2024, Invited
      • SRAMウィークPUFに基づいた秘密置換を利用したエッジデバイスセキュリティ向けストロングPUF
        劉 昆洋; 篠原 尋史
        電子情報通信学会集積回路研究会(ICD)、メモリ技術と集積回路技術一般, 10 Apr. 2023, Invited
      • 情報セキュリティのためのラッチ形静的および動的乱数発生回路
        篠原 尋史; 劉 昆洋; 張 瑞琳; 王 興宇
        電子情報通信学会集積回路研究会(ICD)、アナログ、アナデジ混載、RF及びセンサインタフェース回路、低電圧・低消費電力技術、新デバイス・回路とその応用, 18 Aug. 2021, Invited
      • A 373F2 2D-Power-Gated EE SRAM Physically Unclonable Function with Dark‐Bit Detection Technique
        Kunyang Liu; Hirofumi Shinohara
        電子情報通信学会集積回路研究会(ICD)、メモリ技術と集積回路技術一般, 22 Apr. 2019, Invited

      Awards

      • 20 Jan. 2025
        Best Design Award at ACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) 2025
      • 18 Apr. 2023
        2022 VLSI-DAT Best Paper Award(ITRI&IEEE)
      • 22 Nov. 2019
        ISIPS2019 Presentation Award Selected by IPS Students(早稲田大学)
      • 15 Nov. 2017
        ISIPS2017 Best Paper Award(早稲田大学大学院情報生産システム研究科)
      • 01 Feb. 2021
        2020 Excellent Student Award of The IEEE Fukuoka Section(IEEE Fukuoka Section)
      • 13 Nov. 2020
        ISIPS2020 Session Best Presentation Award(早稲田大学)
      • 05 Nov. 2018
        2018 IEEE SSCS A-SSCC Student Travel Grant Award(IEEE SSCS)

      External funds: Kakenhi

      • Research on Low-Power High-Stability IoT Security Circuits Achieved Through Semiconductor Aging Technique
        Grant-in-Aid for Early-Career Scientists
        Basic Section 60040:Computer system-related
        Kyoto University
        劉 昆洋
        From 01 Apr. 2025, To 31 Mar. 2028, Granted
        PUF;TRNG;ハードウェアセキュリティ;エージング;半導体集積回路
      list
        Last Updated :2026/09/04

        Education

        Teaching subject(s)

        • From 01 Apr. 2026, To 31 Mar. 2027
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        • From 01 Apr. 2025, To 31 Mar. 2026
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        • From 01 Apr. 2024, To 31 Mar. 2025
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        list
          Last Updated :2026/09/04

          Academic, Social Contribution

          Committee Memberships

          • From Jul. 2024, To Present
            Editorial Committee Member, IEICE Transactions on Electronics Special Section on Solid-State Circuit Design --- Architecture, Circuit, Device and Design Methodology
          • From Jun. 2024, To Present
            Editorial Committee Member, IPSJ Journal of Information Processing
          • From Jun. 2024, To Present
            Technical Committee Member, IEICE Technical Committee on Integrated Circuits and Devices (ICD)
          • From Apr. 2024, To Present
            Technical Committee Member, IPSJ Special Interest Group on System and LSI Design Methodology (SLDM)

          Academic Contribution

          • IEEE Transactions on Circuits and Systems I: Regular Papers
            Peer review
          • IEEE JOURNAL OF SOLID-STATE CIRCUITS
            Peer review
          • IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
            Peer review
          • IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
            Peer review

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