Origins of the variability of the electrical characteristics of solution-processed carbon nanotube thin-film transistors and integrated circuits
Jun Hirotani; Shigeru Kishimoto; Yutaka Ohno
Nanoscale Advances, 2019年, 査読有り
Purification of 1.9-nm-diameter semiconducting single-wall carbon nanotubes by temperature-controlled gel-column chromatography and its application to thin-film transistor devices