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Kobayashi, Kei

Graduate School of Engineering, Division of Electronic Science and Engineering Associate Professor

Kobayashi, Kei
list
    Last Updated :2025/04/23

    Basic Information

    Affiliated programs (koza)

    • Graduate School of Engineering, 工学研究科 電気電子工学科

    Faculty

    • Faculty of Engineering

    Professional Memberships

    • The Japan Society of Applied Physics
    • The Japan Society of Vacuum and Surface Sciences

    Academic Degree

    • 修士（工学）(京都大学)
    • 博士（工学）(京都大学)

    Academic Resume (Graduate Schools)

    • 京都大学, 大学院工学研究科修士課程電子物性工学専攻, 修了
    • 京都大学, 大学院工学研究科博士後期課程電子物性工学専攻, 修了

    Academic Resume (Undergraduate School/Majors)

    • 京都大学, 工学部電子工学科, 卒業

    Research History

    • From Oct. 2016, To Present
      Kyoto University, Graduate School of Engineering, Department of Electronic Science and Engineering, 准教授
    • From 01 Jul. 2017
      Graduate School of Engineering, Kyoto University, Associate Professor
    • From Apr. 2013, To Sep. 2016
      Kyoto University, 白眉センター, 特定准教授
    • From Apr. 2010, To Mar. 2013
      Kyoto University, Office of Society-Academia Collaboration for Innovation, 助教
    • From Jul. 2007, To Mar. 2010
      Kyoto University, 産官学連携センター, 助教
    • From Apr. 2007, To Jun. 2007
      Kyoto University, 国際融合創造センター, 助教
    • From May 2001, To Mar. 2007
      Kyoto University, 国際融合創造センター, 助手
    • From Apr. 2000, To Apr. 2001
      Kyoto University, JSPS Research Fellow

    Language of Instruction

    • English
    • Japanese

    ID,URL

    researchmap URL

    list
      Last Updated :2025/04/23

      Research

      Research Interests

      • Organic Electronics
      • Solid-Liquid Interface
      • Atomic Force Microscopy
      • Scanning Probe Microscopy

      Research Areas

      • Nanotechnology/Materials, Nanobioscience
      • Nanotechnology/Materials, Thin-film surfaces and interfaces

      Papers

      • Charge injection barrier at the pentacene thin film and electrode interface characterized by time-resolved electrostatic force microscopy
        Tomoharu Kimura; Kei Kobayashi; Yuji Yamagishi; Hirofumi Yamada
        Applied Physics Letters, 23 Dec. 2024
      • Visualization of molecular chains of P(VDF-TrFE) crystals using force modulation microscopy
        Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Toshihisa Horiuchi; Kenji Ishida; Kazumi Matsushige
        Polymer Preprints, Japan, 2006
      • Orientation control and its detection of polymer molecules using AFM (II)
        Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Toshihisa Horiuchi; Kenji Ishida; Kazumi Matsushige
        Polymer Preprints, Japan, 2006
      • Exploring the Molecular-Scale Structures at Solid/Liquid Interfaces of Li-Ion Battery Materials: A Force Spectroscopy Analysis with Sparse Modeling
        Yuji Yamagishi; Satoru Ohuchi; Emiko Igaki; Kei Kobayashi
        Nano Letters, 29 May 2024
      • Nanoscale visualization of fast carrier dynamics in organic thin-film transistors by time-resolved electrostatic force microscopy
        Yuji Yamagishi; Kei Kobayashi; Tomoharu Kimura; Kei Noda; Hirofumi Yamada
        Journal of Applied Physics, 28 Mar. 2024
      • Protein nanoarrays using the annexin A5 two-dimensional crystal on supported lipid bilayers
        Hiroaki Kominami; Yoshiki Hirata; Hirofumi Yamada; Kei Kobayashi
        Nanoscale Advances, 2023
      • Morphological and functional characterizations of SnO2 electron extraction layer on transparent conductive oxides in lead-halide perovskite solar cells
        Ayane Murota; Kengo Oka; Ryotaro Hayashi; Kentaro Fujiwara; Takushi Nishida; Kei Kobayashi; Youhei Numata; Kenichi Yamashita
        Applied Physics Letters, 09 May 2022
      • Structured Water Molecules on Membrane Proteins Resolved by Atomic Force Microscopy
        Shinichiro Ido; Kei Kobayashi; Noriaki Oyabu; Yoshiki Hirata; Kazumi Matsushige; Hirofumi Yamada
        Nano Letters, 23 Mar. 2022
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      • Acoustically induced light gyration in nickel nanoparticles
        M. K. Zamorskii; K. Nouneh; K. Kobayashi; M. Oyama; J. Ebothe; A. H. Reshak
        OPTICS AND LASER TECHNOLOGY, Apr. 2008, Peer-reviewed
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      • delta-BiB3O6:Pr3+: polymer nanocomposites deposited on substrates with silver nanoparticles for nonlinear optics
        I. Fuks-Janczarek; R. Miedzinski; M. Chrunik; A. Majchrowski; K. Kobayashi; X. M. Chen; M. Oyama; L. R. Jaroszewicz; M. Pepczynska; A. Wojciechowski
        JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, Sep. 2015, Peer-reviewed
      • Nonlinear optical properties of Au nanoparticles on indium-tin oxide substrate
        Kityk, IV; J Ebothe; Fuks-Janczarek, I; AA Umar; K Kobayashi; M Oyama; B Sahraoui
        NANOTECHNOLOGY, Sep. 2005, Peer-reviewed
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      • Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy
        Yuya Yamada; Takashi Ichii; Toru Utsunomiya; Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Hiroyuki Sugimura
        Nanoscale Advances, 2023, Peer-reviewed
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      • Molecular-Resolution Imaging of Interfacial Solvation of Electrolytes for Lithium-Ion Batteries by Frequency Modulation Atomic Force Microscopy
        Yuji Yamagishi; Hiroaki Kominami; Kei Kobayashi; Yuki Nomura; Emiko Igaki; Hirofumi Yamada
        Nano Letters, 28 Dec. 2022
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      • In-situ imaging of pore-forming toxin on model membrane using FM-AFM
        Hirata Yoshiki; Kominami Hiroaki; Kobayashi Kei; Tanaka Mutsuo; Kurosawa Shigeru; Yamada Hirofumi
        JSAP Annual Meetings Extended Abstracts, 04 Sep. 2019
      • 溶液中FM-AFMを用いた有機・生体分子材料表面の水和構造イメージング
        平田 芳樹; 木南 裕昭; 小林 圭; 山田 啓文; 田中 睦生; 黒澤 茂
        バイオイメージング, Aug. 2018
      • Imaging of Pore Forming Toxins (PFT’s) on Model Membrane by FM-AFM in liquid
        Hirata Yoshiki; Kominami Hiroaki; Kobayashi Kei; Tanaka Mutsuo; Yamada Hirofumi
        JSAP Annual Meetings Extended Abstracts, 25 Aug. 2017
      • Observation of Hydration Structure in the Process of Phase Transition of Calcium Carbonate Crystal
        Yuki ARAKI; Katsuo TSUKAMOTO; Ryosuke TAKAGI; Tomoyuki MIYASHITA; Noriaki OYABU; Kei KOBAYASHI; Hirofumi YAMADA
        Vacuum and Surface Science, 10 Nov. 2022, Peer-reviewed, Invited
      • Charge compensation by long-period reconstruction in strongly polar lithium niobate surfaces
        S. Sanna; S. Rode; R. Hoelscher; S. Klassen; C. Marutschke; K. Kobayashi; H. Yamada; W. G. Schmidt; A. Kuehnle
        PHYSICAL REVIEW B, Sep. 2013, Peer-reviewed
      • Nanomechanics of self-assembled surfactants revealed by frequency-modulation atomic force microscopy
        Kenichi Umeda; Kei Kobayashi; Hirofumi Yamada
        Nanoscale, 2022
      • <大学の研究・動向> 分子ナノエレクトロニクス研究の現状
        松重 和美; 山田 啓文; 石田 謙司; 堀内 俊寿; 小林 圭
        Cue : 京都大学電気関係教室技術情報誌, Jun. 2004
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      • Molecular-scale hydration structures on heterogeneously charged surfaces by frequency modulation atomic force microscopy
        Umeda Kenichi; Kobayashi Kei; Zivanovic Lidija; Spijker Peter; Foster Adam S.; Yamada Hirofumi
        Abstract of annual meeting of the Surface Science of Japan, 2016
      • Surface charge density measurement of a single protein molecule with a controlled orientation by AFM
        Yuki Yamamoto; Hiroaki Kominami; Kei Kobayashi; Hirofumi Yamada
        Biophysical Journal, Jun. 2021, Peer-reviewed
      • Low-Background Tip-Enhanced Raman Spectroscopy Enabled by a Plasmon Thin-Film Waveguide Probe
        Kaifeng Zhang; Yifan Bao; Maofeng Cao; Shin-ichi Taniguchi; Masahiro Watanabe; Takuya Kambayashi; Toshihiro Okamoto; Masanobu Haraguchi; Xiang Wang; Kei Kobayashi; Hirofumi Yamada; Bin Ren; Takehiro Tachizaki
        Analytical Chemistry, 01 Jun. 2021, Peer-reviewed
      • Atomic-level nature of solid/liquid interface for energy conversion revealed by frequency modulation atomic force microscopy
        Taketoshi MINATO; Ken-ichi Umeda; Kei Kobayashi; Yuki Araki; Hiroaki Konishi; Zempachi Ogumi; Takeshi Abe; Hiroshi ONISHI; Hirohumi Yamada
        Japanese Journal of Applied Physics, 10 May 2021, Peer-reviewed
      • Molecular-Scale Solvation Structures of Ionic Liquids on a Heterogeneously Charged Surface
        Kenichi Umeda; Kei Kobayashi; Taketoshi Minato; Hirofumi Yamada
        The Journal of Physical Chemistry Letters, 01 Oct. 2020, Peer-reviewed
      • Experimental study on molecular fluctuations of biomolecules by force spectroscopy
        Yuki Yamamoto; Hiroaki Kominami; Kei Kobayashi; Hirofumi Yamada
        Japanese Journal of Applied Physics, 01 Jun. 2020, Peer-reviewed
      • Atomic-Scale Three-Dimensional Local Solvation Structures of Ionic Liquids
        Kenichi Umeda; Kei Kobayashi; Taketoshi Minato; Hirofumi Yamada
        The Journal of Physical Chemistry Letters, 04 Feb. 2020, Peer-reviewed
      • Molecular-scale visualization and surface charge density measurement of Z-DNA in aqueous solution
        Hiroaki Kominami; Kei Kobayashi; Hirofumi Yamada
        Scientific Reports, Dec. 2019, Peer-reviewed
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      • Atomic-Level Viscosity Distribution in the Hydration Layer
        K. Umeda; K. Kobayashi; T. Minato; H. Yamada
        Physical Review Letters, Mar. 2019, Peer-reviewed
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      • Investigation of Local Hydration Structures of Alkanethiol Self-Assembled Monolayers with Different Molecular Structures by FM-AFM
        A. Fujita; K. Kobayashi; H. Yamada
        Langmuir, Nov. 2018, Peer-reviewed
      • Atomic-Scale 3D Local Hydration Structures Influenced by Water-Restricting Dimensions
        Kenichi Umeda; Kei Kobayashi; Taketoshi Minato; Hirofumi Yamada
        Langmuir, 07 Aug. 2018, Peer-reviewed
      • Immunoactivity of self-assembled antibodies investigated by atomic force microscopy
        Hiroaki Kominami; Kei Kobayashi; Shinichiro Ido; Hirokazu Kimiya; Hirofumi Yamada
        RSC Advances, Aug. 2018, Peer-reviewed
      • Atomic-Scale Hydration Structures on a Heterogeneously Charged Surface Revealed by FM-AFM and MD Simulation
        Kenichi Umeda; Lidija Zivanovic; Kei Kobayashi; Peter Spijker; Adam S. Foster; Hirofumi Yamada
        Vacuum and Surface Science, Jun. 2018, Peer-reviewed
      • Local carrier dynamics in organic thin film transistors investigated by time-resolved Kelvin probe force microscopy
        Yuji Yamagishi; Kei Kobayashi; Tomoharu Kimura; Kei Noda; Hirofumi Yamada
        Organic Electronics: physics, materials, applications, 01 Jun. 2018, Peer-reviewed
      • Practical aspects of kelvin probe force microscopy in liquids
        Kei Kobayashi; Hirofumi Yamada
        Springer Series in Surface Sciences, 2018, Peer-reviewed
      • Atomic-resolution three-dimensional hydration structures on a heterogeneously charged surface
        Kenichi Umeda; Lidija Zivanovic; Kei Kobayashi; Juha Ritala; Hiroaki Kominami; Peter Spijker; Adam S. Foster; Hirofumi Yamada
        Nature Communications, 01 Dec. 2017, Peer-reviewed
      • Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation
        Nobuo Satoh; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2017, Peer-reviewed
      • Visualization of Au Nanoparticles Buried in a Polymer Matrix by Scanning Thermal Noise Microscopy
        Atsushi Yao; Kei Kobayashi; Shunta Nosaka; Kuniko Kimura; Hirofumi Yamada
        SCIENTIFIC REPORTS, Feb. 2017, Peer-reviewed
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      • Surface potential measurements of organic thin-film transistors by Kelvin-Probe force microscopy
        Kei Kobayashi; Hirofumi Yamada
        Journal of the Vacuum Society of Japan, 2017, Peer-reviewed
      • Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation
        Satoh Nobuo; Nakahara Masayuki; Kobayashi Kei; Watanabe Shunji; Fujii Toru; Matsushige Kazumi; Yamada Hirofumi
        IEICE NONLINEAR THEORY AND ITS APPLICATIONS, 2017, Peer-reviewed
      • Direct investigations of the interface impedance of organic field-effect transistors with self-assembled-monolayer-modified electrodes
        Tomoharu Kimura; Kei Kobayashi; Hirofumi Yamada
        ORGANIC ELECTRONICS, Nov. 2016, Peer-reviewed
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      • Visualization of subsurface nanoparticles in a polymer matrix using resonance tracking atomic force acoustic microscopy and contact resonance spectroscopy
        Kuniko Kimura; Kei Kobayashi; Atsushi Yao; Hirofumi Yamada
        NANOTECHNOLOGY, Oct. 2016, Peer-reviewed
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      • Twin-Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter
        Nobuo Satoh; Eika Tsunemi; Kei Kobayashi; Takashi Komatsubara; Seiji Higuchi; Kazumi Matsushige; Hirofumi Yamada
        ELECTRONICS AND COMMUNICATIONS IN JAPAN, Sep. 2016, Peer-reviewed
      • Molecular Resolution of the Water Interface at an Alkali Halide with Terraces and Steps
        Fumiaki Ito; Kei Kobayashi; Peter Spijker; Lidija Zivanovic; Kenichi Umeda; Tarmo Nurmi; Nico Holmberg; Kari Laasonen; Adam S. Foster; Hirofumi Yamada
        JOURNAL OF PHYSICAL CHEMISTRY C, Sep. 2016, Peer-reviewed
      • Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever
        Nobuo Satoh; Kei Kobayashi; Shunji Watanabe; Toru Fujii; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2016, Peer-reviewed
      • Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps
        Yuji Yamagishi; Kei Kobayashi; Kei Noda; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Feb. 2016, Peer-reviewed
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      • Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy
        Tomoharu Kimura; Kei Kobayashi; Hirofumi Yamada
        JOURNAL OF APPLIED PHYSICS, Aug. 2015, Peer-reviewed
      • Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy
        Nobuo Satoh; Michio Yamaki; Kei Noda; Shigetaka Katori; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2015, Peer-reviewed
      • Influence of Al-doped ZnO and Ga-doped ZnO substrates on third harmonic generation of gold nanoparticles
        I. V. Kityk; N. S. AlZayed; Kei Kobayashi; Xiaomei Chen; Munetaka Oyama; A. M. El-Naggar; A. A. Albassam
        PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, Jul. 2015, Peer-reviewed
      • Molecular-scale quantitative charge density measurement of biological molecule by frequency modulation atomic force microscopy in aqueous solutions
        Kenichi Umeda; Kei Kobayashi; Noriaki Oyabu; Kazumi Matsushige; Hirofumi Yamada
        NANOTECHNOLOGY, Jul. 2015, Peer-reviewed
      • Twin-probe Atomic Force Microscopy with Optical Beam Deflection using Vertically Incident Lasers by Two Beam Splitter
        Nobuo Satoh; Eika Tsunemi; Kei Kobayashi; Takashi Komatsubara; Seiji Higuchi; Kazumi Matsushige; Hirofumi Yamada
        IEEJ Transactions on Sensors and Micromachines, Apr. 2015
      • Atom-Resolved Analysis of an Ionic KBr(001) Crystal Surface Covered with a Thin Water Layer by Frequency Modulation Atomic Force Microscopy
        Toyoko Arai; Masashi Koshioka; Kouhei Abe; Masahiko Tomitori; Ryohei Kokawa; Masahiro Ohta; Hirofumi Yamada; Kei Kobayashi; Noriald Oyabu
        LANGMUIR, Apr. 2015, Peer-reviewed
      • Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy
        Nobuo Satoh; Shigetaka Katori; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        IEICE TRANSACTIONS ON ELECTRONICS, Feb. 2015, Peer-reviewed
      • Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy
        Yuji Yamagishi; Kei Noda; Kei Kobayashi; Hirofumi Yamada
        JOURNAL OF PHYSICAL CHEMISTRY C, Feb. 2015, Peer-reviewed
      • Recent progress in frequency modulation atomic force microscopy in liquids
        Kei Kobayashi; Hirofumi Yamada
        NanoScience and Technology, 2015, Peer-reviewed
      • Surface potential investigation of fullerene derivative film on platinum electrode under UV irradiation by Kelvin probe force microscopy using a piezoelectric cantilever
        Nobuo Satoh; Shigetaka Katori; Kei Kobayashi; Shunji Watanabe; Toru Fujii; Kazumi Matsushige; Hirofumi Yamada
        e-Journal of Surface Science and Nanotechnology, 2015, Peer-reviewed
      • Accurate formula for dissipative interaction in frequency modulation atomic force microscopy
        Kazuhiro Suzuki; Kei Kobayashi; Aleksander Labuda; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Dec. 2014, Peer-reviewed
      • Scanning near-feild optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever
        Nobuo Satoh; Kei Kobayashi; Shunji Watanabe; Toru Fujii; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Dec. 2014, Peer-reviewed
      • Direct Observation of the Influence of Additives on Calcite Hydration by Frequency Modulation Atomic Force Microscopy
        Yuki Araki; Katsuo Tsukamoto; Ryosuke Takagi; Tomoyuki Miyashita; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada
        CRYSTAL GROWTH & DESIGN, Dec. 2014, Peer-reviewed
      • Nonlinear optical features of delta-BiB3O6/PVA polymer nanocomposites deposited on aluminum-doped zinc oxide substrates containing Ag nanoparticles
        I. Fuks-Janczarek; K. Kobayashi; X. M. Chen; M. Oyama; A. Wojciechowski; M. Pepczynska; M. Chrunik; A. Majchrowski; L. R. Jaroszewicz; S. Klosowicz; I. V. Kityk
        PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, Nov. 2014, Peer-reviewed
      • Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media
        Ken-ichi Umeda; Kei Kobayashi; Noriaki Oyabu; Yoshiki Hirata; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF APPLIED PHYSICS, Oct. 2014, Peer-reviewed
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      • Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy
        Nobuo Satoh; Shigetaka Katori; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, May 2014, Peer-reviewed
      • High-resolution imaging of biological molecules by frequency modulation atomic force microscopy
        Kei Kobayashi; Hirofumi Yamada
        Atomic Force Microscopy in Nanobiology, 30 Apr. 2014, Peer-reviewed
      • Immunoactive two-dimensional self-assembly of monoclonal antibodies in aqueous solution revealed by atomic force microscopy
        Shinichiro Ido; Hirokazu Kimiya; Kei Kobayashi; Hiroaki Kominami; Kazumi Matsushige; Hirofumi Yamada
        NATURE MATERIALS, Mar. 2014, Peer-reviewed
      • Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping
        Kazuhiro Suzuki; Kei Kobayashi; Noriaki Oyabu; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF CHEMICAL PHYSICS, Feb. 2014, Peer-reviewed
      • Photothermal excitation setup for a modified commercial atomic force microscope
        Holger Adam; Sebastian Rode; Martin Schreiber; Kei Kobayashi; Hirofumi Yamada; Angelika Kuehnle
        REVIEW OF SCIENTIFIC INSTRUMENTS, Feb. 2014, Peer-reviewed
      • High-resolution Visualization of Biological Molecules using Frequency Modulation Atomic Force Microscopy
        KOBAYASHI Kei; YAMADA Hirofumi
        IEEJ Transactions on Sensors and Micromachines, 2014
      • Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy
        Masaharu Hirose; Eika Tsunemi; Kei Kobayashi; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Oct. 2013, Peer-reviewed
      • Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques
        Kuniko Kimura; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Ultramicroscopy, Oct. 2013, Peer-reviewed
      • Visualization of Charge Injection Processes in Polydiacetylene Thin Film Grains by Dual-Probe Atomic Force Microscopy
        Masaharu Hirose; Eika Tsunemi; Kei Kobayashi; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2013, Peer-reviewed
      • Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams
        Eika Tsunemi; Kei Kobayashi; Noriaki Oyabu; Masaharu Hirose; Yoshiko Takenaka; Kazumi Matsushige; Hirofumi Yamada
        REVIEW OF SCIENTIFIC INSTRUMENTS, Aug. 2013, Peer-reviewed
      • Erratum: Investigation of electrical transport in anodized single TiO 2 nanotubes (Applied Physics Letters (2013) 102 (043105))
        Masashi Hattori; Kei Noda; Tatsuya Nishi; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        Applied Physics Letters, 15 Jul. 2013, Peer-reviewed
      • Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy
        Kei Kobayashi; Noriaki Oyabu; Kenjiro Kimura; Shinichiro Ido; Kazuhiro Suzuki; Takashi Imai; Katsunori Tagami; Masaru Tsukada; Hirofumi Yamada
        JOURNAL OF CHEMICAL PHYSICS, May 2013, Peer-reviewed
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      • Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces
        Ken-Ichi Umeda; Kei Kobayashi; Noriaki Oyabu; Yoshiki Hirata; Kazumi Matsushige; Hirofumi Yamada
        Journal of Applied Physics, Apr. 2013, Peer-reviewed
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      • Beyond the Helix Pitch: Direct Visualization of Native DNA in Aqueous Solution
        Shinichiro Ido; Kenjiro Kimura; Noriaki Oyabu; Kei Kobayashi; Masaru Tsukada; Kazumi Matsushige; Hirofumi Yamada
        ACS NANO, Feb. 2013, Peer-reviewed
      • Monotonic Damping in Nanoscopic Hydration Experiments
        Aleksander Labuda; Kei Kobayashi; Kazuhiro Suzuki; Hirofumi Yamada; Peter Gruetter
        PHYSICAL REVIEW LETTERS, Feb. 2013, Peer-reviewed
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      • Investigation of electrical transport in anodized single TiO2 nanotubes
        Masashi Hattori; Kei Noda; Tatsuya Nishi; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        Applied Physics Letters, 28 Jan. 2013, Peer-reviewed
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      • Multi-probe atomic force microscopy using piezo-resistive cantilevers and interaction between probes
        N. Satoh; E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada
        e-Journal of Surface Science and Nanotechnology, Jan. 2013, Peer-reviewed
      • Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy
        Masanao Ito; Kei Kobayashi; Yuji Miyato; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Jan. 2013, Peer-reviewed
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      • Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields
        Ken-ichi Umeda; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Sep. 2012, Peer-reviewed
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      • Atomic-resolution imaging of the polar (0001?) surface of LiNbO 3 in aqueous solution by frequency modulation atomic force microscopy
        S. Rode; R. Holscher; S. Sanna; S. Klassen; K. Kobayashi; H. Yamada; W.G. Schmidt; A. Kuhnle
        Physical Review B - Condensed Matter and Materials Physics, 29 Aug. 2012, Peer-reviewed
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      • Atomic-Resolution Imaging of Aragonite (001) Surface in Water by Frequency Modulation Atomic Force Microscopy
        Yuki Araki; Katsuo Tsukamoto; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2012, Peer-reviewed
      • Resistive Switching Effects in Metallic Nanogap Electrode Fabricated by Electroless Gold Plating
        Yasuhisa Naitoh; Shuhei Takeshita; Daiki Ishida; Eiji Ohmura; Kei Kobayashi; Hirofumi Yamada; Yutaka Majima
        APPLIED PHYSICS EXPRESS, Aug. 2012, Peer-reviewed
      • Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy
        Tomoharu Kimura; Yuji Miyato; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2012, Peer-reviewed
      • Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
        Aleksander Labuda; Kei Kobayashi; Yoichi Miyahara; Peter Gruetter
        REVIEW OF SCIENTIFIC INSTRUMENTS, May 2012, Peer-reviewed
      • Fabrication of glycerol liquid droplet array by nano-inkjet printing method
        Kiyohiro Kaisei; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF APPLIED PHYSICS, Apr. 2012, Peer-reviewed
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      • Real-time investigation on photocatalytic oxidation of gaseous methanol with nanocrystalline WO3-TiO2 composite films
        Shivaji B. Sadale; Kei Noda; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        THIN SOLID FILMS, Mar. 2012, Peer-reviewed
      • Local interaction imaging by SiGe quantum dot probe
        Yonkil Jeong; Masato Hirade; Ryohei Kokawa; Hirofumi Yamada; Kei Kobayashi; Noriaki Oyabu; Toyoko Arai; Akira Sasahara; Masahiko Tomitori
        CURRENT APPLIED PHYSICS, Mar. 2012, Peer-reviewed
      • Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy
        Kazuhiro Suzuki; Noriaki Oyabu; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS EXPRESS, Dec. 2011, Peer-reviewed
      • Intricate photocatalytic decomposition behavior of gaseous methanol with nanocrystalline tungsten trioxide films in high vacuum
        Shivaji B. Sadale; Kei Noda; Kei Kobayashi; Kazumi Matsushige
        APPLIED SURFACE SCIENCE, Sep. 2011, Peer-reviewed
      • Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
        S. Rode; R. Stark; J. Lubbe; L. Troger; J. Schutte; K. Umeda; K. Kobayashi; H. Yamada; A. Kuhnle
        Review of Scientific Instruments, Jul. 2011, Peer-reviewed
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      • Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium-Tin Oxide by Kelvin Probe Force Microscopy
        Shigetaka Katori; Nobuo Satoh; Masayuki Yahiro; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige; Shizuo Fujita
        JAPANESE JOURNAL OF APPLIED PHYSICS, Jul. 2011, Peer-reviewed
      • Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments
        A. Labuda; K. Kobayashi; D. Kiracofe; K. Suzuki; P. H. Gruetter; H. Yamada
        AIP ADVANCES, Jun. 2011, Peer-reviewed
      • Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever
        Nobuo Satoh; Shigetaka Katori; Kei Kobayashi; Shunji Watanabe; Toru Fujii; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF APPLIED PHYSICS, Jun. 2011, Peer-reviewed
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      • Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode
        K. Nishi; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada
        e-Journal of Surface Science and Nanotechnology, Apr. 2011, Peer-reviewed
      • Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy
        M. Ito; Y. Hosokawa; R. Nishi; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada
        e-Journal of Surface Science and Nanotechnology, Apr. 2011, Peer-reviewed
      • Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip
        Kiyohiro Kaisei; Nobuo Satoh; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        NANOTECHNOLOGY, Apr. 2011, Peer-reviewed
      • <大学の研究・動向>環境調和型エレクトロニクスの現状と展開 : 分子系エレクトロニクスおよび電気自動車研究
        松重 和美; 山田 啓文; 野田 啓; 小林 圭
        Cue : 京都大学電気関係教室技術情報誌, Mar. 2011
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      • Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams
        Eika Tsunemi; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        REVIEW OF SCIENTIFIC INSTRUMENTS, Mar. 2011, Peer-reviewed
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      • Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy
        Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        REVIEW OF SCIENTIFIC INSTRUMENTS, Mar. 2011, Peer-reviewed
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      • Resistive switching effects in single metallic tunneling junction with nanometer-scale gap
        Takahiro Mizukami; Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Feb. 2011, Peer-reviewed
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      • Hydrogen production from gas phase photocatalytic decomposition of methanol using Pt-supported nanocrystalline WO3 films
        Shivaji B. Sadale; Kei Noda; Kei Kobayashi; Kazumi Matsushige
        PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 2, 2011, Peer-reviewed
      • A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy (vol 81, 093701, 2010)
        Yoshihiro Hosokawa; Kei Kobayashi; Noriaki Oyabu; Kazumi Matsushige; Hirofumi Yamada
        REVIEW OF SCIENTIFIC INSTRUMENTS, Jan. 2011, Peer-reviewed
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      • Gas phase photocatalytic decomposition of alcohols with titanium dioxide nanotube arrays in high vacuum
        Masashi Hattori; Kei Noda; Kei Kobayashi; Kazumi Matsushige
        PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 2, 2011, Peer-reviewed
      • High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids
        Daniel Kiracofe; Kei Kobayashi; Aleksander Labuda; Arvind Raman; Hirofumi Yamada
        REVIEW OF SCIENTIFIC INSTRUMENTS, Jan. 2011, Peer-reviewed
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      • Frequency noise in frequency modulation atomic force microscopy (vol 80, 043708, 2009)
        Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        REVIEW OF SCIENTIFIC INSTRUMENTS, Dec. 2010, Peer-reviewed
      • Aqueous Solution Structure over alpha-Al2O3(01(1)over-bar2) Probed by Frequency-Modulation Atomic Force Microscopy
        Takumi Hiasa; Kenjiro Kimura; Hiroshi Onishi; Masahiro Ohta; Kazuyuki Watanabe; Ryohei Kokawa; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada
        JOURNAL OF PHYSICAL CHEMISTRY C, Dec. 2010, Peer-reviewed
      • A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy
        Yoshihiro Hosokawa; Kei Kobayashi; Noriaki Oyabu; Kazumi Matsushige; Hirofumi Yamada
        REVIEW OF SCIENTIFIC INSTRUMENTS, Sep. 2010, Peer-reviewed
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      • Investigations of Local Electrical Properties of Pentacene Thin Films by Dual-Probe Atomic Force Microscopy
        Masaharu Hirose; Eika Tsunemi; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2010, Peer-reviewed
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      • Development of High-Resolution Imaging of Solid-Liquid Interface by Frequency Modulation Atomic Force Microscopy
        Katsuyuki Suzuki; Shin-ichi Kitamura; Shukichi Tanaka; Kei Kobayashi; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2010, Peer-reviewed
      • Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever
        Nobuo Satoh; Takeshi Fukuma; Kei Kobayashi; Shunji Watanabe; Toru Fujii; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Jun. 2010, Peer-reviewed
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      • Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by FM-AFM
        Ken Nagashima; Masayuki Abe; Seizo Morita; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada; Masahiro Ohta; Ryohei Kokawa; Ryota Murai; Hiroyoshi Matsumura; Hiroaki Adachi; Kazufumi Takano; Satoshi Murakami; Tsuyoshi Inoue; Yusuke Mori
        J. Vac. Sci. Technol. B, May 2010
      • Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy
        Nagashima Ken; Abe Masayuki; Morita Seizo; Oyabu Noriaki; Kobayashi Kei; Yamada Hirofumi; Ohta Masahiro; Kokawa Ryohei; Murai Ryota; Matsumura Hiroyoshi; Adachi Hiroaki; Takano Kazufumi; Murakami Satoshi; Inoue Tsuyoshi; Mori Yusuke
        JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, May 2010, Peer-reviewed
      • Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy
        Eika Tsunemi; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, May 2010, Peer-reviewed
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      • Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy
        Ken Nagashima; Masayuki Abe; Seizo Morita; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada; Masahiro Ohta; Ryohei Kokawa; Ryota Murai; Hiroyoshi Matsumura; Hiroaki Adachi; Kazufumi Takano; Satoshi Murakami; Tsuyoshi Inoue; Yusuke Mori
        JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, May 2010, Peer-reviewed
      • Visualizing water molecule distribution by atomic force microscopy
        Kenjiro Kimura; Shinichiro Ido; Noriaki Oyabu; Kei Kobayashi; Yoshiki Hirata; Takashi Imai; Hirofumi Yamada
        JOURNAL OF CHEMICAL PHYSICS, May 2010, Peer-reviewed
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      • Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip
        Kiyohiro Kaisei; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        ULTRAMICROSCOPY, May 2010, Peer-reviewed
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      • Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy
        Eika Tsunemi; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, 2010, Peer-reviewed
      • Submolecular-scale Investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy
        Takashi Ichii; Takeshi Fukuma; Tadashi Yoda; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JOURNAL OF APPLIED PHYSICS, Jan. 2010, Peer-reviewed
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      • Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry
        Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, Peer-reviewed
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      • Electrospray induced ferroelectricity in poly(vinylidene fluoride) thin films
        Ivo B. Rietveld; Kei Kobayashi; Takuya Honjo; Kenji Ishida; Hirofumi Yamada; Kazumi Matsushige
        JOURNAL OF MATERIALS CHEMISTRY, 2010, Peer-reviewed
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      • Position Control and Electrical Characterization of Single-Walled Carbon Nanotubes Debundled by Density Gradient Ultracentrifugation
        Katsuhiro Kaneko; Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, Peer-reviewed
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      • High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method
        Ken-ichi Umeda; Noriaki Oyabu; Kei Kobayashi; Yoshiki Hirata; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS EXPRESS, 2010, Peer-reviewed
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      • Ionic Liquid Thin Film Fabrication Using Nano-Inkjet Printing Method
        Kiyohiro Kaisei; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, Peer-reviewed
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      • Process parameters for fast production of ultra-thin polymer film with electrospray deposition under ambient conditions
        Ivo B. Rietveld; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        JOURNAL OF COLLOID AND INTERFACE SCIENCE, Nov. 2009, Peer-reviewed
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      • Molecular Resolution Imaging of Protein Molecules in Liquid Using Frequency Modulation Atomic Force Microscopy
        Hirofumi Yamada; Kei Kobayashi; Takeshi Fukuma; Yoshiki Hirata; Teruyuki Kajita; Kazumi Matsushige
        APPLIED PHYSICS EXPRESS, Sep. 2009, Peer-reviewed
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      • Reproducible noncontact force spectroscopy for studying molecules
        Yoshihiro Hosokawa; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        MEASUREMENT SCIENCE AND TECHNOLOGY, Sep. 2009, Peer-reviewed
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      • Controlling chaos in dynamic-mode atomic force microscope
        Kohei Yamasue; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige; Takashi Hikihara
        PHYSICS LETTERS A, Aug. 2009, Peer-reviewed
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      • Solution-TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopy
        Takumi Hiasa; Kenjiro Kimura; Hiroshi Onishi; Masahiro Ohta; Kazuyuki Watanabe; Ryohei Kokawa; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Aug. 2009, Peer-reviewed
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      • Frequency noise in frequency modulation atomic force microscopy
        Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        REVIEW OF SCIENTIFIC INSTRUMENTS, Apr. 2009, Peer-reviewed
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      • True Atomic-Resolution Imaging of (10(1)over-bar4) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy
        Sebastian Rode; Noriaki Oyabu; Kei Kobayashi; Hirofumi Yamada; Angelika Kuehnle
        LANGMUIR, Mar. 2009, Peer-reviewed
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      • Molecular-resolution imaging of lead phthalocyanine molecules by small amplitude frequency modulation atomic force microscopy using second flexural mode
        Takashi Ichii; Yoshihiro Hosokawa; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Mar. 2009, Peer-reviewed
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      • Electrospray deposition producing ultra-thin polymer films with a regular surface structure
        Ivo B. Rietveld; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        SOFT MATTER, 2009, Peer-reviewed
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      • Small amplitude frequency modulation atomic force microscopy of lead phthalocyanine molecules using cantilever with very high spring constant
        Yoshihiro Hosokawa; Takashi Ichii; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS, Jul. 2008, Peer-reviewed
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      • Electrospray deposition of photoresist: A low impact method for the fabrication of multilayered films
        Ivo B. Rietveld; Naotoshi Suganuma; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        MACROMOLECULAR MATERIALS AND ENGINEERING, May 2008, Peer-reviewed
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      • Surface Potential Evaluations of Ferritin Nanodots by Kelvin Force Microscopy
        S.Yamamoto; K. Kobayashi; H. Yamada; H. Yoshioka; Y.Uraoka; T.Fuyuki; M. Okuda; I.Yamashita
        Journal of Scann Pobe Microsc. vol. 3, 1-6, 01 Apr. 2008
      • Submolecular resolution viscoelastic imaging of a poly(p-toluene-sulfonate) single crystal using force modulation microscopy
        Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        NANOTECHNOLOGY, Feb. 2008, Peer-reviewed
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      • Effect of ferroelectric/metal interface structure on polarization reversal
        Satoshi Horie; Kenji Ishida; Shuichiro Kuwajima; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushge
        JAPANESE JOURNAL OF APPLIED PHYSICS, Feb. 2008, Peer-reviewed
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      • Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy
        Taichi Nishio; Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Feb. 2008, Peer-reviewed
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      • The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor
        Taichi Nishio; Yuji Miyato; Kei Kobayashi; Kenji Ishida; Kazumi Matsushige; Hirofumi Yamada
        NANOTECHNOLOGY, Jan. 2008, Peer-reviewed
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      • High resolution molecular chain imaging of a poly(vinylidenefluoride-trifluoroethylene) crystal using force modulation microscopy
        K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige
        Nanotechnology, 01 Aug. 2007, Peer-reviewed
      • Real-time detection of photocatalytic hydrogen production for platinized titanium dioxide thin films in high vacuum
        Kei Noda; Masashi Hattori; Kouichi Amari; Kei Kobayashi; Toshihisa Horiuchi; Kazurni Matsushige
        JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, Aug. 2007, Peer-reviewed
      • Multi-probe atomic force Microscopy with optical beam deflection method
        Eika Tsunemi; Nobuo Satoh; Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, Aug. 2007, Peer-reviewed
      • Multi-probe atomic force microscopy using piezoelectric cantilevers
        Nobuo Satoh; Eika Tsunemi; Yuji Miyato; Kei Kobayashi; Shunji Watanabe; Toru Fuji; Kazumi Matsushige; Hirofumi Yamada
        JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, Aug. 2007, Peer-reviewed
      • Investigation of molecular chain orientation change of polymer crystals in phase transitions by friction anisotropy measurement
        Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        LANGMUIR, Apr. 2007, Peer-reviewed
      • Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry
        Yuji Miyato; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        NANOTECHNOLOGY, Feb. 2007, Peer-reviewed
      • Noncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devices
        Kenjiro Kimura; Kei Kobayashi; Kazumi Matsushige; Koji Usuda; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Feb. 2007, Peer-reviewed
      • Model supported morphology control of electrospray deposited poly(vinylidene fluoride) film
        Ivo B. Rietveld; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        MACROMOLECULAR SYMPOSIA, 2007, Peer-reviewed
      • Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes
        Kenjiro Kimura; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        APPLIED PHYSICS LETTERS, Jan. 2007, Peer-reviewed
      • Electrospray deposition, model, and experiment: Toward general control of film morphology
        Ivo B. Rietveld; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        JOURNAL OF PHYSICAL CHEMISTRY B, Nov. 2006, Peer-reviewed
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      • Morphology control of poly(vinylidene fluoride) thin film made with electrospray
        I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige
        Journal of Colloid and Interface Science, 15 Jun. 2006, Peer-reviewed
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      • Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy
        K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda
        Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, May 2006, Peer-reviewed
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      • Study on orientation mechanisms of poly(vinylidenefluoride-trifluoroethylene) molecules aligned by atomic force microscopy
        Kuniko Kimura; Kei Kobayashi; Hirofumi Yamada; Toshihisa Horiuchi; Kenji Ishida; Kazumi Matsushige
        APPLIED SURFACE SCIENCE, May 2006, Peer-reviewed
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      • Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method
        Takeshi Fukuma; Kenjiro Kimura; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada; Hirofumi Yamada
        Review of Scientific Instruments, Dec. 2005, Peer-reviewed
      • Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors
        K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda
        Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Jul. 2005, Peer-reviewed
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      • True atomic resolution in liquid by frequency-modulation atomic force microscopy
        Takeshi Fukuma; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Applied Physics Letters, Jul. 2005, Peer-reviewed
      • Increase in carrier mobility of organic ultrathin-film transistor with increasing molecular layers investigated by Kelvin probe force microscopy
        T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; K. Matsushige; H. Yamada
        Journal of Applied Physics, 15 Jun. 2005, Peer-reviewed
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      • Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy
        T. Ichii; M. Urabe; T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada
        Jpn. J. Appl. Phys., Jun. 2005, Peer-reviewed
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      • Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
        Takeshi Fukuma; Masayuki Kimura; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Review of Scientific Instruments, May 2005, Peer-reviewed
      • True molecular resolution in liquid by frequency-modulation atomic force microscopy
        Takeshi Fukuma; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Applied Physics Letters, May 2005, Peer-reviewed
      • Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy
        Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Apr. 2005, Peer-reviewed
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      • Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy
        T. Ichii; H. Kawabata; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige
        Nanotechnology, Mar. 2005, Peer-reviewed
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      • Study on molecular chain orientation in edge-on crystals of vinylidenefluoride-trifluoroethylene copolymer using lateral modulation friction force microscopy
        K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige
        Polymer Preprints, Japan, 2005, Peer-reviewed
      • True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments
        T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige
        Appl. Phys. Lett., Jan. 2005, Peer-reviewed
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      • Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method
        Takeshi Fukuma; Kenjiro Kimura; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada
        Applied Physics Letters, Dec. 2004, Peer-reviewed
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      • Orientation Control of High-Density Polyethylene Molecular Chains Using Atomic Force Microscope
        Kimura Kuniko; Kobayashi Kei; Yamada Hirofumi; Horiuchi Toshihisa; Ishida Kenji; Matsushige Kazumi
        Jpn J Appl Phys, 01 Nov. 2004
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      • Surface potential measurements by the dissipative force modulation method
        Takeshi Fukuma; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        Review of Scientific Instruments, Nov. 2004, Peer-reviewed
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      • Investigations of nanoparticles by scanning near-field optical microscopy combined with kelvin probe force microscopy using a piezoelectric cantilever
        N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jul. 2004, Peer-reviewed
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      • Orientation control of molecular chains in polymers using atomic force microscopy
        K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jul. 2004, Peer-reviewed
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      • Noncontact Atomic Force Microscopy Investigation of Phase-Separated Alkanethiol Self-Assembled Monolayers with Different Head Groups
        T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige
        Jpn. J. Appl. Phys., Jul. 2004, Peer-reviewed
      • Submolecular-Resolution Studies on Metal-Phthalocyanines by Noncontact Atomic Force Microscopy
        Tadashi Yoda; Takashi Ichii; Takeshi Fukuma; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        Jpn. J. Appl. Phys., Jul. 2004, Peer-reviewed
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      • Structures and electrical properties of ferroelectric copolymer ultrathin films
        K. Kobayashi; H. Masuda; H. Yamada; K. Matsushige
        European Polymer Journal, May 2004, Peer-reviewed
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      • Orientation control of ferroelectric polymer molecules using contact-mode AFM
        K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige
        European Polymer Journal, May 2004, Peer-reviewed
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      • Noncontact atomic force microscopy study of copper-phthalocyanines: Submolecular-scale contrasts in topography and energy dissipation
        Takeshi Fukuma; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige
        Journal of Applied Physics, May 2004, Peer-reviewed
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      • Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4×2) superlattice structures of alkanethiol self-assembled monolayers
        T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige
        J. Appl. Phys., Feb. 2004, Peer-reviewed
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      • Surface potential measurements of phase-separated alkanethiol self-assembled monolayers by non-contact atomic force microscopy
        T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige
        Nanotechnology, Feb. 2004, Peer-reviewed
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      • Nanoscale electrical properties of molecular films in the vicinity of platinum ultrathin film electrode
        T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jul. 2003, Peer-reviewed
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      • Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever
        N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jul. 2003, Peer-reviewed
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      • Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy
        K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige
        Applied Physics Letters, 09 Jun. 2003, Peer-reviewed
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      • Fabrication of nanogap electrodes using ultrathin metal film
        T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jun. 2003, Peer-reviewed
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      • Two-dimensional dopant profiling by scanning capacitance force microscopy
        K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige
        Applied Surface Science, 31 Mar. 2003, Peer-reviewed
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      • Effect of water adsorption on microscopic friction force on SrTiO3(001)
        K. Iwahori; S. Watanabe; M. Kawai; K. Kobayashi; H. Yamada; K. Matsushige
        Journal of Applied Physics, 15 Mar. 2003, Peer-reviewed
      • Phase-separated alkanethiol self-assembled monolayers investigated by non-contact AFM
        T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige
        Applied Surface Science, Mar. 2003, Peer-reviewed
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      • Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
        SATOH Nobuo; WATANABE Shunji; FUJII Toru; KOBAYASHI Kei; YAMADA Hirofumi; MATSUSHIGE Kazumi
        IEICE transactions on electronics, 01 Dec. 2002
      • Dopant profiling on semiconducting sample by scanning capacitance force microscopy
        K. Kobayashi; H. Yamada; K. Matsushige
        Applied Physics Letters, 30 Sep. 2002, Peer-reviewed
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      • Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides
        T. Fukuma; K. Kobayashi; K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige; K. Matsushige
        Surface Science, Sep. 2002, Peer-reviewed
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      • Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
        MIYAZAKI Takashi; KOBAYASHI Kei; YAMADA Hirofumi; HORIUCHI Toshihisa; MATSUSHIGE Kazumi
        Japanese journal of applied physics. Pt. 1, Regular papers & short notes, 30 Jul. 2002
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      • Experimental study on energy dissipation induced by displacement current in non-contact aomic force microscopy imaging of molecular thin films
        Takeshi Fukuma; Keiichi Umeda; Kei Kobayashi; Hirofumi Yamada; Kazumi Matsushige; Kazumi Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jul. 2002, Peer-reviewed
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      • Dynamic force microscopy using FM detection in various environments
        K. Kobayashi; H. Yamada; K. Matsushige
        Applied Surface Science, 28 Mar. 2002, Peer-reviewed
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      • Dynamic-mode AFM using the piezoelectric cantilever: Investigations of local optical and electrical properties
        N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige
        Applied Surface Science, 28 Mar. 2002, Peer-reviewed
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      • Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy
        H. Yamada; T. Fukuma; K. Umeda; K. Kobayashi; K. Matsushige
        Applied Surface Science, Mar. 2002, Peer-reviewed
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      • Resonance tracking ultrasonic atomic force microscopy
        K. Kobayashi; H. Yamada; K. Matsushige
        Surface and Interface Analysis, Feb. 2002, Peer-reviewed
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      • Analog frequency modulation detector for dynamic force microscopy
        K. Kobayashi; H. Yamada; H. Itoh; T. Horiuchi; K. Matsushige
        Review of Scientific Instruments, Dec. 2001, Peer-reviewed
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      • Alkanethiol Self-Assembled Monolayers on Au(111) surfaces investigated by non-contact AFM
        T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige
        Applied Physics A: Materials Science and Processing, Dec. 2001, Peer-reviewed
      • Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy
        T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige
        Thin Solid Films, Nov. 2001, Peer-reviewed
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      • Fabrication of a nanogap on a metal nanowire using scanning probe lithography
        T. Miyazaki; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jun. 2001, Peer-reviewed
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      • Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy
        K. Umeda; K. Kobayashi; K. Ishida; S. Hotta; H. Yamada; K. Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Jun. 2001, Peer-reviewed
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      • Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy
        Takeshi Fukuma; Kei Kobayashi; Toshihisa Horiuchi; Hirofumi Yamada; Kazumi Matsushige
        Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Dec. 2000, Peer-reviewed
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      • Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
        KOBAYASHI Kei; YAMADA Hirofumi; HORIUCHI Toshihisa; MATSUSHIGE Kazumi
        Japanese journal of applied physics. Pt. 1, Regular papers & short notes, 30 Jun. 2000
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      • Normal and lateral force investigation using magnetically activated force sensors
        SP Jarvis; H Yamada; K Kobayashi; A Toda; H Tokumoto
        APPLIED SURFACE SCIENCE, Apr. 2000, Peer-reviewed
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      • Imaging of fullerene molecules on Si(111)-7×7 surface with NC-AFM
        K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige
        Applied Surface Science, Apr. 2000, Peer-reviewed
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      • Dynamic Force Microscopy Investigations of C_<60> Deposited on Si(111) Surface
        KOBAYASHI Kei; YAMADA Hirofumi; HORIUCHI Toshihisa; MATSUSHIGE Kazumi
        Japanese journal of applied physics. Pt. 2, Letters, 15 Dec. 1999
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      • Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy
        S.P. Jarvis; H. Tokumoto; H. Yamada; K. Kobayashi; A. Toda
        Applied Physics Letters, 13 Dec. 1999, Peer-reviewed
      • Scanning near-field optical microscopy using piezoelectric cantilevers
        H. Yamada; H. Itoh; S. Watanabe; K. Kobayashi; K. Matsushige
        Surface and Interface Analysis, 1999, Peer-reviewed
      • UHV-STM studies on the structures of alkanedithiol self-assembled monolayers
        K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige
        Applied Surface Science, 1999, Peer-reviewed
      • Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy
        K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige
        Applied Surface Science, 1999, Peer-reviewed
      • STM studies on nanoscopic structures and electric characteristics of alkanethiol and alkanedithiol self-assembled monolayers
        K Kobayashi; T Horiuchi; H Yamada; K Matsushige
        THIN SOLID FILMS, Oct. 1998, Peer-reviewed
      • Structural study on self-assembled monolayers of alkanedithiol molecules
        K Kobayashi; J Umemura; T Horiuchi; H Yamada; K Matsushige
        JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, Mar. 1998, Peer-reviewed
      • Structures and Electrical Properties of Self-Assembled Monolayers of Alkanethiol and Alkanedithiol
        Kei Kobayashi; Toshihisa Horiuchi; Hirofumi Yamada; Kazumi Matsushige
        MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1998, Peer-reviewed
      • Nanoscopic analysis of the conduction mechanism in organic positive temperature coefficient: Composite materials
        K Matsushige; K Kobayashi; N Iwami; T Horiuchi; E Shitamori; M Itoh
        THIN SOLID FILMS, Feb. 1996, Peer-reviewed

      Misc.

      • 原子間力顕微鏡による有機分子・生体試料の分子分解能観察
        山田 啓文; 小林 圭
        印刷雑誌, 19 Aug. 2005
      • Kyoto Instruments-Instrumentation of Scanning Probe Methods
        KOBAYASHI Kei
        高分子, 01 Oct. 2000
      • Atomic-scale Observation of Hydration Structure of Calcite Surfaces by FM-AFM
        Araki Yuki; Tsukamoto Katsuo; Takagi Ryosuke; Miyashita Tomoyuki; Oyabu Noriaki; Kobayashi Kei; Yamada Hirofumi
        Journal of the Japanese Association of Crystal Growth, 2015
      • Imaging of Antibody Molecules by Frequency-Modulation Atomic Force Microscopy
        KOBAYASHI Kei; YAMADA Hirofumi
        Seibutsu Butsuri, Mar. 2016
      • 合成ポリペプチドとマグネシウムの添加によるカルサイト表面の原子レベルの水和構造の変化
        荒木優希; 塚本勝男; 高木良介; 宮下知幸; 大藪範昭; 小林圭; 山田啓文
        結晶成長国内会議予稿集(CD-ROM), 2013
      • 原子間力顕微鏡を用いた単接合型ナノギャップ電極における抵抗スイッチング現象のその場観察
        石田大貴; 小林圭; 松重和美; 清水哲夫; 内藤泰久; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 29 Feb. 2012
      • 点接触電流イメージングAFMを用いた有機薄膜トランジスタにおける局所電気特性評価
        木村知玄; 宮戸祐治; 小林圭; 山田啓文; 松重和美
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2012
      • 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製(3)
        池田尚弘; 伊藤正尚; 小林圭; 宮戸祐治; 松重和美; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2012
      • 周波数変調検出方式高周波静電気力顕微鏡法を用いたカーボンナノチューブの局所欠陥評価
        池田尚弘; 宮戸祐治; 小林圭; 野田啓; 山田啓文
        応用物理学会学術講演会講演予稿集(CD-ROM), 2012
      • FM‐AFMによるカルサイト結晶表面の水和構造その場観察
        荒木優希; 塚本勝男; 高木良介; 宮下知幸; 大藪範昭; 小林圭; 山田啓文
        結晶成長国内会議予稿集(CD-ROM), 2012
      • エレクトロマイグレーション法による単接合型抵抗スイッチング素子の作製
        石田大貴; 小林圭; 松重和美; 清水哲夫; 内藤泰久; 山田啓文
        応用物理学会学術講演会講演予稿集(CD-ROM), 16 Aug. 2011
      • 単接合型Ptナノギャップ電極の抵抗スイッチング特性に与える配線抵抗の影響
        石田大貴; HAN Jiwon; 宮戸祐治; 小林圭; 松重和美; 清水哲夫; 内藤泰久; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 09 Mar. 2011
      • ケルビンプローブ原子間力顕微鏡による微小サイズ試料の表面電位測定における定量性
        伊藤正尚; 西立司; 細川義浩; 宮戸祐治; 小林圭; 山田啓文; 松重和美
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2011
      • 点接触電流イメージングAFMによるペンタセン薄膜の局所電気特性の評価
        木村知玄; 宮戸祐治; 小林圭; 山田啓文; 松重和美
        応用物理学会学術講演会講演予稿集(CD-ROM), 2011
      • 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製
        宮戸祐治; 池田尚弘; 小林圭; 松重和美; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2011
      • カーボンナノチューブの表面電位の定量解析法
        西立司; 伊藤正尚; 宮戸祐治; 大藪範昭; 小林圭; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2011
      • 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製(2)
        池田尚弘; 伊藤正尚; 小林圭; 宮戸祐治; 松重和美; 山田啓文
        応用物理学会学術講演会講演予稿集(CD-ROM), 2011
      • アラゴナイト形成過程原子分解能その場観察
        荒木優希; 木村勇気; 塚本勝男; 高木良介; 宮下知幸; 大藪範昭; 小林圭; 山田啓文
        結晶成長国内会議予稿集(CD-ROM), 2011
      • 簡易真空下における探針-試料間相互作用力・トンネル電流同時検出
        宮戸祐治; 小林圭; 松重和美; 山田啓文
        応用物理学会学術講演会講演予稿集(CD-ROM), 2010
      • ケルビンプローブ原子間力顕微鏡を用いたカーボンナノチューブ上の表面/空間電位分布測定
        伊藤正尚; 西立司; 細川義浩; 宮戸祐治; 小林圭; 山田啓文; 松重和美
        応用物理学会学術講演会講演予稿集(CD-ROM), 2010
      • ストロボ走査型ゲート顕微鏡によるカーボンナノチューブの欠陥評価
        宮戸祐治; 小林圭; 松重和美; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2010
      • 密度勾配超遠心分離法による(6,5)SWNTの単離とその配向制御および電気特性評価
        金子勝弘; 宮戸祐治; 小林圭; 松重和美; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2010
      • バイアス-フォースカーブ法によるCN-FETデバイス上における3次元静電気力マッピング
        西立司; 宮戸祐治; 大藪範昭; 小林圭; 松重和美; 山田啓文
        応用物理学関係連合講演会講演予稿集(CD-ROM), 2010
      • 低温環境下における金属ナノギャップ電極の抵抗スイッチング現象評価
        水上貴博; 宮戸祐治; 小林圭; 山田啓文; 松重和美; 清水哲夫; 内藤泰久
        応用物理学会学術講演会講演予稿集, 08 Sep. 2009
      • 合成ポリペプチド添加によるカルサイト基板上でのアラゴナイト核形成―FM‐AFMによる原子分解能その場観察―
        荒木優希; 塚本勝男; 丸山美帆子; 宮下知幸; 山田啓文; 小林圭; 大藪範昭
        結晶成長国内会議予稿集, 2009
      • 単接合ナノギャップスイッチのAFMによる構造変化観察
        水上貴博; 宮戸祐治; 小林圭; 山田啓文; 松重和美; 清水哲夫; 内藤泰久
        応用物理学関係連合講演会講演予稿集, 27 Mar. 2008
      • Local potential imaging of a multilayer ceramic capacitor using Kelvin Probe force microscopy
        T. Komatsubara; S. Higuchi; K. Nishikata; N. Satoh; K. Kobayashi; H. Yamada
        Microscopy and Microanalysis, 2008, Peer-reviewed
      • Photocatalytic hydrogen production from gas-phase methanol and water with nanocrystalline TiO2 thin films in high vacuum
        K. Noda; M. Hattori; K. Amari; K. Kobayashi; T. Horiuchi; K. Matsushige
        Materials Research Society Symposium Proceedings, 2008, Peer-reviewed
      • Electrical Characterisitics of ferritin cores Investegated by Kelvin Probe Force Microscopy
        Shin-ichi Yamamoto; Kei Kobayashi; Hirofumi Yamada; Hideki Yoshioka; Yukiharu Uraoka; Takashi Fuyuki; Ichiro Yamashita
        PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2008, Peer-reviewed
      • 走査型容量顕微鏡によるMOSFET動作時の不純物分布計測
        臼田 宏治; 木村 建次郎; 小林 圭; 山田 啓文
        表面科学, 2007
      • 誘電泳動による分子配向 −単一/少数分子デバイス構築に向けて−
        宮戸 祐治; 小林 圭; 松重 和美; 山田 啓文
        機能材料, 2006
      • TWO-DIMENSIONAL CARRIER PROFILING ON OPERATING SIMOSFET BY SCANNING CAPACITANCE MICROSCOPY
        K. Kimura; K. Kobayashi; H. Yamada; K. Usuda; K. Matsushige
        Proceedings of the 8th International Workshop on the Fabrication, Characterization and Modeling of Ultra Shallow Junctions in Semiconductors, 2005
      • Surface Potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever
        K. Kobayashi; H. Yamada; K. Umeda; T. Horiuchi; S. Watanabe; T. Fujii; S. Hotta; K. Matsushige
        Applied Physics A: Materials Science and Processing, 2001, Peer-reviewed
      • High-Resolution Imaging of Organic Molecules by UHV-AFM
        Kobayashi Kei; Yamada Hirofumi; Horiuchi Toshihisa; Matsushige Kazumi
        Technical report of IEICE. OME, 23 Oct. 1998
      • The Molecular Arrangements of Alkanethiol Self-Assembled Monolayers on Au (111) Studied by Scanning Tunneling Microscopy
        Kei Kobayashi; Hirofumi Yamada; Toshihisa Horiuchi; Kazumi Matsushige
        Jpn. J. Appl. Phys., 1998

      Industrial Property Rights

      • 薄膜及びその製造方法(THIN FILM AND METHOD FOR MANUFACTURING SAME)
      • 物性値の測定方法および走査型プローブ顕微鏡
      • 走査型プローブ顕微鏡
      • 走査型プローブ顕微鏡
      • 特願2019-139696, 計測装置、原子間力顕微鏡、および計測方法
        小林 圭; 木村 邦子; 山田 啓文

      Awards

      • 24 Sep. 2002
        社団法人応用物理学会, 第12回応用物理学会講演奨励賞
      • 21 Jul. 2004
        日本学術振興会ナノプローブテクノロジー第167委員会, 平成15年度ナノプローブテクノロジー賞
      • 13 Nov. 2008
        社団法人日本表面科学会, 平成20年度日本表面科学会技術賞
      • 13 Nov. 2008
        日本表面科学会, 日本表面科学会技術賞
      • 21 Jul. 2004
        日本学術振興会ナノプローブテクノロジー第167委員会, ナノプローブテクノロジー賞
      • 24 Sep. 2002
        応用物理学会, 応用物理学会講演奨励賞

      External funds: Kakenhi

      • Investigations on Energy Dissipation Mechanisms in Atomic Force Microscopy in Liquids
        Grant-in-Aid for Scientific Research (B)
        Basic Section 29020:Thin film/surface and interfacial physical properties-related
        Kyoto University
        Kei Kobayashi
        From 01 Apr. 2019, To 31 Mar. 2022, Project Closed
        原子間力顕微鏡;固液界面;エネルギー散逸
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19H02598/
      • Direct visualization of molecular recognition forces by high-resolution atomic force microscopy and spectroscopy
        Grant-in-Aid for Scientific Research (S)
        Kyoto University
        Hirofumi YAMADA
        From 31 May 2017, To 31 Mar. 2022, Project Closed
        原子間力顕微鏡;フォースマッピング;単一分子イメージング;単一分子分光;ナノ計測;走査プローブ顕微鏡
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-17H06122/
      • ３次元フォース解析による生体分子－溶液界面の構造・機能可視化
        Grant-in-Aid for Scientific Research (A)
        Kyoto University
        山田 啓文
        From 01 Apr. 2017, To 31 Mar. 2018, Discontinued
        FM-AFM;３次元フォースマッピング;特異結合力;水和殻;走査プローブ顕微鏡
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-17H01059/
      • Imaging subsurface features by scanning thermal noise microscopy and investigation of its imaging mechanism
        Grant-in-Aid for Challenging Exploratory Research
        Kyoto University
        Kei Kobayashi
        From 01 Apr. 2016, To 31 Mar. 2018, Project Closed
        走査型プローブ顕微鏡;原子間力顕微鏡;接触粘弾性;表面下構造;カンチレバー;超音波;表面構造可視化;表面下構造可視化
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-16K13686/
      • Investigation of relationship between local hydration structures and surface structures using atomic force microscopy
        Grant-in-Aid for Scientific Research (B)
        Kyoto University
        Kei Kobayashi
        From 01 Apr. 2016, To 31 Mar. 2019, Project Closed
        走査プローブ顕微鏡;原子間力顕微鏡;固液界面;３次元フォースマッピング;瞬時周波数法;固液界面物性;3次元フォースマッピング
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-16H03870/
      • Application of 3-dimensional force mapping method to the measurement of biomolecule fluctuations
        Grant-in-Aid for Challenging Exploratory Research
        Kyoto University
        Hirofumi YAMADA
        From 01 Apr. 2014, To 31 Mar. 2016, Project Closed
        走査プローブ顕微鏡;3次元フォースマッピング技術;３次元フォースマッピング技術
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-26600101/
      • Development of scanning Seebeck microscopy for investigation of local thermoelectric properties of organic materials
        Grant-in-Aid for Challenging Exploratory Research
        Kyoto University
        Kei KOBAYASHI
        From 01 Apr. 2013, To 31 Mar. 2015, Project Closed
        原子間力顕微鏡;熱電材料;カンチレバー光熱励振;通電加熱カンチレバー;走査プローブ顕微鏡;光熱励振
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-25600097/
      • Investigation of hydration structures and surface charges on biomolecules by three-dimensional force mapping
        Grant-in-Aid for Scientific Research (B)
        Kyoto University
        Kei Kobayahi
        From 01 Apr. 2013, To 31 Mar. 2016, Project Closed
        走査プローブ顕微鏡;原子間力顕微鏡;FM-AFM;フォースマッピング;固液界面
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-25286057/
      • 3次元フォースマッピング法による生体分子-溶液界面の構造・機能可視化
        Grant-in-Aid for Scientific Research (A)
        Kyoto University
        山田 啓文
        From 01 Apr. 2012, To 31 Mar. 2013, Discontinued
        走査プローブ顕微鏡;水和構造;フォースマップ
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-24246016/
      • Molecular-scale functional visualization of bio- and nano-materials by AFM functional probes
        Grant-in-Aid for Scientific Research (S)
        Kyoto University
        Hirofumi YAMADA
        From 31 May 2012, To 31 Mar. 2017, Project Closed
        ナノ計測;原子間力顕微鏡;水和構造計測;3次元フォースマップ;３次元フォースマップ
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-24221008/
      • Nanometer cale surface charge mapping in liquids
        Grant-in-Aid for Young Scientists (A)
        Kyoto University
        Kei KOBAYASHI
        From 01 Apr. 2010, To 31 Mar. 2013, Project Closed
        走査プローブ顕微鏡;原子間力顕微鏡;カンチレバー;溶液環境
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22686007/
      • Ultrasonic testing by multi-probe atomic force microscopy
        Grant-in-Aid for Challenging Exploratory Research
        Kyoto University
        Kei KOBAYASHI
        From 01 Apr. 2010, To 31 Mar. 2012, Project Closed
        走査型プローブ顕微鏡;多探針;超音波
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22656013/
      • Proximal multi-probe measurement and control method for nanometer-scale strrctures based on frequency modulation AFM
        Grant-in-Aid for Scientific Research (S)
        Kyoto University
        Hirofumi YAMADA
        From 01 Apr. 2007, To 31 Mar. 2012, Project Closed
        走査型プローブ顕微鏡;マルチAFMプローブ技術;ナノ空間相関;ナノ刺激応答;液中高分解能;生体分子;FM-AFM;KFM;振動散逸エネルギー;有機分子薄膜;液中高分解能イメージング;生体分子イメージング;マルチプローブAFM技術;駅流高分解能イメージング;生体イメージング;静電気力マッピング
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19106001/
      • Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes
        Grant-in-Aid for Scientific Research on Priority Areas
        Science and Engineering
        Kyoto University
        Hirofumi YAMADA
        From 01 Apr. 2007, To 31 Mar. 2012, Project Closed
        カーボンナノチューブ;原子間力顕微鏡(AFM);ケルビンプローブAFM;周波数変調(FM)検出法;高分解能マルチプローブAFM;密度勾配遠心分離;誘電泳動;3次元フォースマップ;表面電位計測;AFMポテンショメトリー;走査ゲート顕微鏡;高分解能マルチプローブ技術;AFMポテンショメトー;高分解能マルチプローブ計測;表面電位;点接触AFM
        https://kaken.nii.ac.jp/grant/KAKENHI-PLANNED-19054010/
      • 多重反射方式マイクロカンチレバーアレイを用いた高感度バイオセンサーの開発
        Grant-in-Aid for Exploratory Research
        Kyoto University
        小林 圭
        From 01 Apr. 2006, To 31 Mar. 2008, Project Closed
        走査型プローブ顕微鏡
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-18651056/
      • Developments of infrared sensor using organic ferroelectric thinfilms
        Grant-in-Aid for Scientific Research (B)
        Kobe University
        Kenji ISHIDA
        From 01 Apr. 2006, To 31 Mar. 2009, Project Closed
        強誘電体;有機分子;薄膜;構造制御;赤外センサー;フレキシブル;焦電;有機材料;超薄膜;誘電体物性;赤外センサ
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-18360147/
      • Carrier Accumulation Control in Semiconductors and Nonvolatile Memory Application with Organic Ferroelectric Dipoles
        Grant-in-Aid for Scientific Research (A)
        Kyoto University
        Kazumi MATSUSHIGE
        From 01 Apr. 2006, To 31 Mar. 2009, Project Closed
        強誘電体;有機分子;不揮発メモリ;界面;トランジスタ型メモリ;ナノデバイス;空乏層;半導体;不揮発性メモリ
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-18206033/
      • Polarization study of molecules at surfaces by scanning probe method
        Grant-in-Aid for Scientific Research (A)
        Kyoto University
        Hirofumi YAMADA
        From 01 Apr. 2002, To 31 Mar. 2005, Project Closed
        ダイナミックモード原子間力顕微鏡;DFM;NC-AFM;ケルビンプローブ原子間力顕微鏡;KFM;分子分解能観察;分子分極;周波数変調検出法;局所電解制御;ナノスケール分極制御;フタロシアニン分子;強誘電性高分子;ダイナミック分極処理;非接触原子間力顕微鏡;アルカンチオール;単一分子物性評価;周波数検出;VDFオリゴマー, dynamic force microscopy;DFM;NC-AFM;Kelvin-probe force microscopy;KFM;molecular-resolution imaging;molecular polarization;frequency modulation detection method
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-14205009/
      • 分子間相互作用を用いた分子の同定と制御
        Grant-in-Aid for Scientific Research on Priority Areas
        Science and Engineering
        Kyoto University
        山田 啓文
        From 01 Apr. 1999, To 31 Mar. 2003, Project Closed
        非接触原子間力顕微鏡;NC-AFM;エネルギー散逸像;ケルビンプローブフォース顕微鏡;KFM;表面電位;分子種識別;分子振動;エネルギー散逸;有機金属界面;分子分極;分子分解能観察;フラーレン分子;ケルビンプローブ顕微鏡;化学修飾探針;自己組織化膜;原子分解能観察;FM検出法;位相同期ループ回路;フラーレン;アルカンチオール
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-11226203/
      • 液中原子分解能探針増強ラマン分光顕微鏡による電極・触媒反応機構の解明
        Grant-in-Aid for Scientific Research (A)
        Medium-sized Section 29:Applied condensed matter physics and related fields
        Kyoto University
        小林 圭
        From 01 Apr. 2022, To 31 Mar. 2025, Granted
        原子間力顕微鏡;探針増強ラマン分光;触媒;電極反応;ナノカーボン
        https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22H00294/
      list
        Last Updated :2025/04/23

        Education

        Teaching subject(s)

        • From 01 Apr. 2024, To 31 Mar. 2025
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        • From 01 Apr. 2024, To 31 Mar. 2025
          Electrical and Electronic Materials
          6043, Fall, Faculty of Engineering, 2
        • From 01 Apr. 2024, To 31 Mar. 2025
          Surface Electronic Properties
          C819, Spring, Graduate School of Engineering, 2
        • From 01 Apr. 2023, To 31 Mar. 2024
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        • From 01 Apr. 2023, To 31 Mar. 2024
          Electrical and Electronic Materials
          6043, Fall, Faculty of Engineering, 2
        • From 01 Apr. 2023, To 31 Mar. 2024
          Surface Electronic Properties
          C819, Spring, Graduate School of Engineering, 2
        • From 01 Apr. 2023, To 31 Mar. 2024
          Molecular Electronics
          C816, Spring, Graduate School of Engineering, 2
        • From 01 Apr. 2022, To 31 Mar. 2023
          Practice of Electrical and Electronic Engineering
          6201, Spring, Faculty of Engineering, 2
        • From 01 Apr. 2022, To 31 Mar. 2023
          Surface Electronic Properties
          C819, Spring, Graduate School of Engineering, 2
        • From 01 Apr. 2022, To 31 Mar. 2023
          Electrical and Electronic Materials
          6043, Fall, Faculty of Engineering, 2
        • From Oct. 2013, To Mar. 2014
          電気電子工学実験B
          Fall, 工学研究科
        • From Oct. 2014, To Mar. 2015
          電気電子工学実験B
          Fall, 工学研究科
        • From Oct. 2015, To Mar. 2016
          電子電気工学実験B
          Fall, 工学研究科
        • From Apr. 2017, To Mar. 2018
          Molecular Electronics
          Spring, 工学研究科
        • From Apr. 2017, To Mar. 2018
          Surface Electronic Properties
          Spring, 工学研究科
        • From Apr. 2017, To Mar. 2018
          Practice of Electrical and Electronic Engineering
          Spring, 工学部
        • From Apr. 2017, To Mar. 2018
          Electrical and Electronic Materials
          Fall, 工学部
        • From Apr. 2018, To Mar. 2019
          Surface Electronic Properties
          Spring, 工学研究科
        • From Apr. 2018, To Mar. 2019
          Practice of Electrical and Electronic Engineering
          Spring, 工学部
        • From Apr. 2018, To Mar. 2019
          Electrical and Electronic Materials
          Fall, 工学部
        • From Apr. 2019, To Mar. 2020
          Molecular Electronics
          Spring, 工学研究科
        • From Apr. 2019, To Mar. 2020
          Surface Electronic Properties
          Spring, 工学研究科
        • From Apr. 2019, To Mar. 2020
          Practice of Electrical and Electronic Engineering
          Spring, 工学部
        • From Apr. 2019, To Mar. 2020
          Electrical and Electronic Materials
          Fall, 工学部
        • From Apr. 2020, To Mar. 2021
          Surface Electronic Properties
          Spring, 工学研究科
        • From Apr. 2020, To Mar. 2021
          Practice of Electrical and Electronic Engineering
          Spring, 工学部
        • From Apr. 2020, To Mar. 2021
          Electrical and Electronic Materials
          Fall, 工学部
        • From Apr. 2021, To Mar. 2022
          Molecular Electronics
          Spring, 工学研究科
        • From Apr. 2021, To Mar. 2022
          Surface Electronic Properties
          Spring, 工学研究科
        • From Apr. 2021, To Mar. 2022
          Practice of Electrical and Electronic Engineering
          Spring, 工学部
        • From Apr. 2021, To Mar. 2022
          Electrical and Electronic Materials
          Fall, 工学部

        Participation in PhD Defense

        • Molecular-Level Understanding of Ionic Liquid/Solid Interfaces: Atomic Force Microscopy Study
          BAO YIFAN, Graduate School of Engineering, Sub-chief Examiner
          25 Mar. 2024
        • Molecular-Level Understanding of Ionic Liquid/Solid Interfaces: Atomic Force Microscopy Study
          BAO YIFAN, Graduate School of Engineering, Sub-chief Examiner
          25 Mar. 2024
        • Study on Forming and Resistive Switching Phenomena in Tantalum Oxide for Analog Memory Devices
          MIYATANI TOSHIKI, Graduate School of Engineering, Sub-chief Examiner
          23 Mar. 2023
        • Short Channel Effects and Mobility Improvement in SiC MOSFETs
          TACHIKI KEITA, Graduate School of Engineering, Sub-chief Examiner
          23 Mar. 2022

        Part-time lecturer

        • From 01 Jul. 2015, To 31 Jul. 2015
          特別講義Ⅰ「ナノ計測工学」
          神戸大学, 工学部
        list
          Last Updated :2025/04/23

          Administration

          School management (title, position)

          • From 01 Apr. 2010, To 31 Mar. 2011
            京都大学情報環境機構 ＫＵＩＮＳ利用負担金検討委員会 委員
          • From 01 Apr. 2011, To 31 Mar. 2013
            ローム記念館運営ワーキンググループ 2号委員

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