Basic Information

Email Address

• Email Address

  zhang.ruilin.5wkyoto-u.ac.jp

Professional Memberships

• From Jan. 2020, To Present

  IEEE Solid-State Circuits Society
• From Mar. 2019, To Present

  IEEE

Academic Degree

• 15 Sep. 2017

  早稲田大学修士（工学）
• 23 May 2022

  早稲田大学博士（工学）

Academic Resume (Graduate Schools)

• 早稲田大学, 大学院情報生産システム研究科情報生産システム工学専攻博士後期課程, 研究指導認定退学
• 早稲田大学, 大学院情報生産システム研究科情報生産システム工学専攻博士前期課程, 修了
• 早稲田大学, 大学院情報生産システム研究科情報生産システム工学専攻 博士前期課程, 修了
• 早稲田大学, 大学院情報生産システム研究科情報生産システム工学専攻 博士後期課程, 研究指導認定退学

Academic Resume (Undergraduate School/Majors)

• 北京化工大学, 信息科学と技術学院 自動制御学科専攻, 卒業
• 銀川外国語実験学校, 卒業

ID,URL

• ORCID ID

  0000-0001-6807-0521

• J-Global ID

  202301019232421968

researchmap URL

• https://researchmap.jp/789012301010

Research

Research Interests

• Hardware security; TRNG; Post-processing algorithm

Papers

• A 0.071pJ/bit Flexible Multi-Mode Logic-Compatible Multiple-Time Programmable (MTP) Memory-Based PUF

  Yao Li; Yijun Cui; Shuming Guo; Jiang Li; Ruilin Zhang; Chongyan Gu; Chenghua Wang; Weiqiang Liu

  IEEE Transactions on Circuits and Systems II: Express Briefs, 2025

  
• De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator

  Ruilin Zhang; Haochen Zhang; Xingyu Wang; Ye Ziyang; Kunyang Liu; Shinichi Nishizawa; Kiichi Niitsu; Hirofumi Shinohara

  IEEE Transactions on Circuits and Systems I: Regular Papers, 2024

  
• A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement

  Xingyu Wang; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara

  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024

  
• A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response

  Kunyang Liu; Yichen Tang; Shufan Xu; Ruilin Zhang; Hirofumi Shinohara

  2023 IEEE Custom Integrated Circuits Conference (CICC), Apr. 2023

  
• Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection

  Shufan Xu; Kunyang Liu; Yichen Tang; Ruilin Zhang; Hirofumi Shinohara

  2023 35th International Conference on Microelectronic Test Structure (ICMTS), 27 Mar. 2023

  
• A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement

  Ruilin Zhang; Xingyu Wang; Kunyang Liu; Hirofumi Shinohara

  IEEE Journal of Solid-State Circuits, Aug. 2022, Peer-reviewed

  
• A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement

  Xingyu Wang; Ruilin Zhang; Yuxin Wang; Kunyang Liu; Xuanzhen Wang; Hirofumi Shinohara

  2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 18 Apr. 2022, Peer-reviewed

  
• A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement

  Ruilin Zhang; Xingyu Wang; Luying Wang; Xinpeng Chen; Fan Yang; Kunyang Liu; Hirofumi Shinohara

  2021 Symposium on VLSI Circuits, 13 Jun. 2021, Peer-reviewed, Lead author

  
• Energy-Efficient Post-Processing Technique Having High Extraction Efficiency for True Random Number Generators

  Zhang, R.; Wang, X.; Shinohara, H.

  IEICE Transactions on Electronics, 2021

  
• An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit

  Xingyu Wang; Hongjie Liu; Ruilin Zhang; Kunyang Liu; Hirofumi Shinohara

  2020 IEEE 63RD INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2020, Peer-reviewed

  
• High-throughput Von Neumann post-processing for random number generator

  Ruilin Zhang; Sijia Chen; Chao Wan; Hirofumi Shinohara

  2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Apr. 2018, Peer-reviewed, Lead author

  

Awards

• 20 Jan. 2025

  Best Design Award at ACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) 2025
• 18 Apr. 2023

  Best paper award(IEEE, The 2022 International Symposium on VLSI Design, Automat)